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Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets (2003)

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by Sunil R. Das , Made Sudarma , Mansour H. Assaf , Emil M. Petriu , Wen-ben Jone , Krishnendu Chakrabarty , Senior Member , Senior Member , Senior Member
Venue:IEEE Trans. Instrum. Meas
Citations:1 - 1 self