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Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets (2003)
| Venue: | IEEE Trans. Instrum. Meas |
| Citations: | 1 - 1 self |
BibTeX
@ARTICLE{Das03paritybit,
author = {Sunil R. Das and Made Sudarma and Mansour H. Assaf and Emil M. Petriu and Wen-ben Jone and Krishnendu Chakrabarty and Senior Member and Senior Member and Senior Member},
title = {Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets},
journal = {IEEE Trans. Instrum. Meas},
year = {2003},
volume = {52},
pages = {1363--1380}
}
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Abstract
Abstract—The design of efficient time compression support hardware for built-in self-testing (BIST) is of great importance in the design and manufacture of VLSI circuits. The test data outputs in BIST are ultimately compressed by the time compaction hardware, commonly called a response analyzer, into signatures. Several output response compaction techniques to aid in the synthesis of such support circuits already exist in literature, and parity bit signature coupled with exhaustive testing is already well known to have certain very desirable properties in this context. This paper reports new time compaction techniques utilizing the concept of parity bit signature that facilitates implementing such support circuits using nonexhaustive or compact test sets, with the primary objective of minimizing the storage requirements for the circuit under test (CUT) while maintaining the fault coverage information as best as possible. Recently, Jone and Das proposed a
Keyphrases
parity bit signature vlsi circuit built-in self-testing nonexhaustive test set response data compaction support circuit new time compaction technique efficient time compression support hardware test data output response analyzer several output response compaction technique great importance compact test set time compaction hardware primary objective desirable property exhaustive testing storage requirement fault coverage information
