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SWITTEST: Automatic Switch-level Fault Simulation and Test Evaluation of Switched-Capacitor Systems (1997)
| Citations: | 2 - 1 self |
BibTeX
@MISC{Mir97swittest:automatic,
author = {S. Mir and A. Rueda and T. Olbrich and E. Peralías and J.L. Huertas},
title = {SWITTEST: Automatic Switch-level Fault Simulation and Test Evaluation of Switched-Capacitor Systems},
year = {1997}
}
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Abstract
A tool for the switch-level fault simulation and test evaluation of switched-capacitor systems is presented. Time or frequencydomain fault simulations with SWITCAP and time-domain fault simulations with HSPICE can be performed. Adequate fault models are presented for both simulators. The tool has proven to be very useful in the early evaluation of test strategies, providing similar results to those obtained at the transistor-level. INTRODUCTION Fault simulation is a widely applied technique to analyze the testability of integrated circuits and to optimize a test approach. For analog and mixed-signal circuits, fault simulations are traditionally performed at the transistor-level using circuit simulators such as HSPICE [1]. Unfortunately, analog fault simulation is a very time consuming task and, even for rather simple circuits, a comprehensive transistor-level fault simulation is normally unfeasible. Macromodels of circuit components are conveniently used to decrease the extremely lon...
Keyphrases
test evaluation switched-capacitor system automatic switch-level fault simulation fault simulation test approach analog fault simulation introduction fault simulation switch-level fault simulation time-domain fault simulation early evaluation similar result simple circuit test strategy adequate fault model integrated circuit comprehensive transistor-level fault simulation mixed-signal circuit circuit component circuit simulator
