DMCA

Large-scale SRAM variability characterization in 45 nm CMOS (2009)

by Zheng Guo , Student Member , Andrew Carlson , Liang-teck Pang , Kenneth T. Duong , Tsu-jae King Liu , Borivoje Nikolić , Senior Member
Venue:IEEE J. Solid-State Circuits
Citations:9 - 4 self