BibTeX
@MISC{Zhang12diagnostictest,
author = {Yu Zhang},
title = {Diagnostic Test Pattern Generation . . . },
year = {2012}
}
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Abstract
In VLSI testing we need Automatic Test Pattern Generator (ATPG) to get input test vectors for Circuit Under Test (CUT). Generated test sets are usually compacted to save test time which is not good for failure diagnosis. Physical defects in circuits are modeled by different Fault Models to facilitate test generation. Stuck-at and transition fault models are widely used because of their practicality. In this work a Diagnostic Automatic Test Pattern Generation (DATPG) system is constructed by adding new algorithmic capabilities to conventional ATPG and fault simulation programs. The DATPG aims to generate tests to distinguish stuck-at fault pairs, i.e., two faults must have different output responses. This will help diagnosis to pin point the failure by narrowing down the fault candidates which may be the reason for this particular failure. Given a fault pair, by modifying circuit netlist a new single fault is modeled. Then we use a conventional ATPG to target that fault. If a test is generated, it is guaranteed to distinguish the fault pair in the original circuit. A fast diagnostic fault simulation algorithm is implemented to find undistinguished fault pairs from a fault list for a given test vector set. To determine the quality of the test vector set
Keyphrases
diagnostic test pattern generation test vector set conventional atpg fault pair different output response test generation failure diagnosis stuck-at fault pair datpg aim different fault model test set fault list physical defect diagnostic automatic test pattern generation undistinguished fault pair automatic test pattern generator fault candidate original circuit test time new algorithmic capability input test vector fault simulation program particular failure fast diagnostic fault simulation algorithm new single fault transition fault model
