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Test pattern generation using Boolean satisfiability (1992)
| Venue: | IEEE Transactions on Computer-Aided Design |
| Citations: | 306 - 15 self |
BibTeX
@ARTICLE{Larrabee92testpattern,
author = {Tracy Larrabee},
title = {Test pattern generation using Boolean satisfiability},
journal = {IEEE Transactions on Computer-Aided Design},
year = {1992},
pages = {4--15}
}
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Abstract
Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted circuits. Second, it applies a Boolean satisjiability algorithm to the resulting formula. This approach differs from previous methods now in use, which search the circuit structure directly instead of constructing a formula from it. The new method is general and effective: it allows for the addition of heuristics used by structural search methods, and it has produced excellent results on popular test pattern generation benchmarks. I.
Keyphrases
test pattern generation boolean satisfiability test pattern new method boolean satisjiability algorithm abstract-this article approach differs structural search method previous method boolean diference popular test pattern generation benchmark faulted circuit single stuck-at fault boolean satisfiability method excellent result combinational circuit circuit structure
