DMCA
Sandia National Labs
BibTeX
@MISC{Hawkins_sandianational,
author = {Charles F. Hawkins and Jerry M. Soden and Alan W. Rigliter and F. Joel Fergusonti},
title = {Sandia National Labs},
year = {}
}
Share
 |
 |
 |
 |
||
OpenURL
Abstract
ABSTRACT: The IC test industry has struggled.for more than 30 years to establish a test approach that would guarantee a low defect level to the customer. We propose a comprehensive strategy for testing CMOS ICs that uses defect classes based on measured defect electrilxd properti'es. Defect classes differ from traditional fault models. Our defect class approach requires that the test strategy match the defect electrical properties, while fault models require that IC defects match the fault definition. We use data from Sandia Labs failure analysis and lest facilities and from public literature [l-601. We describe test pattern requirements for each defect class and propose a test paradigm. I.
Keyphrases
sandia national lab defect class approach test paradigm low defect level test pattern requirement fault model public literature defect class sandia lab failure analysis cmos ic lest facility test approach traditional fault model ic test industry test strategy fault definition defect electrical property measured defect electrilxd properti comprehensive strategy
