BibTeX
@MISC{Hahanov_optimizationof,
author = {V. Hahanov and E. Litvinova and K. Mostovaya},
title = {Optimization of Memory Faults Coverage by Spares},
year = {}
}
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Abstract
Modern tendencies of semiconductor industry devel-opment involve permanent decrease of silicon chip area, increase of quantity and various elements on area unit. Embedded memory elements make up the bulk of compo-
