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Embedded Deterministic Test for Low Cost Manufacturing Test (2002)

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by Janusz Rajski , Jerzy Tyszer , Mark Kassab , Nilanjan Mukherjee , Rob Thompson , Kun-han Tsai , Andre Hertwig , Nagesh Tamarapalli , Grzegorz Mrugalski
Venue:Proc. of Int. Test Conf
Citations:74 - 3 self