At-speed distributed functional testing to detect logic and delay faults in NoCs (2014)

by M Kakoee, V Bertacco, L Benini
Venue:IEEE Trans. on Computers
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Multi-Layer Test and Diagnosis for Dependable NoCs

by Hans-joachim Wunderlich, Martin Radetzki, Hans-joachim Wunderlich, Martin Radetzki
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This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden.
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