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Comparative Power Analysis of LFSR Test Pattern Generators
"... Automatic Test Pattern Generation Automatic Test Pattern Generator is an electronic de-sign automation method used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior c ..."
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caused by defects. The designs selected for comparison use LFSR as its core central component around which the entire algorithms are based which contribute in construction of Automatic test pattern generator. The LFSR is considered as it gives excellent random characteristics and has a low area overhead
Mining Frequent Patterns without Candidate Generation: A Frequent-Pattern Tree Approach
- DATA MINING AND KNOWLEDGE DISCOVERY
, 2004
"... Mining frequent patterns in transaction databases, time-series databases, and many other kinds of databases has been studied popularly in data mining research. Most of the previous studies adopt an Apriori-like candidate set generation-and-test approach. However, candidate set generation is still co ..."
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Cited by 1752 (64 self)
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Mining frequent patterns in transaction databases, time-series databases, and many other kinds of databases has been studied popularly in data mining research. Most of the previous studies adopt an Apriori-like candidate set generation-and-test approach. However, candidate set generation is still
High confidence visual recognition of persons by a test of statistical independence
- IEEE TRANS. ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
, 1993
"... A method for rapid visual recognition of personal identity is described, based on the failure of a statistical test of independence. The most unique phenotypic feature visible in a person’s face is the detailed texture of each eye’s iris: An estimate of its statistical complexity in a sample of the ..."
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Cited by 621 (8 self)
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of the human population reveals variation corresponding to several hundred independent degrees-of-freedom. Morphogenetic randomness in the texture expressed phenotypically in the iris trabecular meshwork ensures that a test of statistical independence on two coded patterns originating from different eyes
Dynamic taint analysis for automatic detection, analysis, and signature generation of exploits on commodity software
- In Network and Distributed Systems Security Symposium
, 2005
"... Software vulnerabilities have had a devastating effect on the Internet. Worms such as CodeRed and Slammer can compromise hundreds of thousands of hosts within hours or even minutes, and cause millions of dollars of damage [32, 51]. To successfully combat these fast automatic Internet attacks, we nee ..."
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Cited by 647 (32 self)
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positives for any of the many different programs that we tested. Further, we show how we can use a two-tiered approach to build a hybrid exploit detector that enjoys the same accuracy as TaintCheck but have extremely low performance overhead. Finally, we propose a new type of automatic signature generation
How Iris Recognition Works
, 2003
"... Algorithms developed by the author for recogniz-ing persons by their iris patterns have now been tested in six field and laboratory trials, producing no false matches in several million comparison tests. The recognition principle is the failure of a test of statis-tical independence on iris phase st ..."
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Cited by 509 (4 self)
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Algorithms developed by the author for recogniz-ing persons by their iris patterns have now been tested in six field and laboratory trials, producing no false matches in several million comparison tests. The recognition principle is the failure of a test of statis-tical independence on iris phase
Generator Using LFSR
"... Abstract: In our project, we propose a novel architecture which generates the test patterns with reduced switching activities. LP-TPG (Test pattern Generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit counter; gray counter, NOR-gate structure and XOR-ar ..."
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Abstract: In our project, we propose a novel architecture which generates the test patterns with reduced switching activities. LP-TPG (Test pattern Generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit counter; gray counter, NOR-gate structure and XOR
GRASP - A New Search Algorithm for Satisfiability
, 1996
"... This paper introduces GRASP (Generic seaRch Algorithm for the Satisjiability Problem), an integrated algorithmic framework for SAT that un.$es several previously proposed searchpruning techniques and facilitates ident$cation of additional ones. GRASP is premised on the inevitability of confzicts dur ..."
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Cited by 449 (34 self)
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that are necessary for a solution to be found. fiperimental results obtained from a large number of benchmarks, including many from the $eld of test pattern generation, indicate that application of the proposed confzict analysis techniques to SATalgorithm can be extremely effectivefor a large number
Test pattern generation using Boolean satisfiability
- IEEE Transactions on Computer-Aided Design
, 1992
"... Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted ..."
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Cited by 306 (14 self)
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Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted
Shift Register (LFSR) for Test Pattern Generation
"... This paper proposes a low power Linear Feedback ..."
Comparison of LFSR and CA for BIST
"... ABSTRACT: Built-In Self-Test (BIST), as the name suggests is a technique in which the circuit is capable of testing itself. This paper presents two techniques: Linear Feedback Shift Register (LFSR) and Cellular Automata (CA), used for test pattern generation and test response analysis in a typical B ..."
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ABSTRACT: Built-In Self-Test (BIST), as the name suggests is a technique in which the circuit is capable of testing itself. This paper presents two techniques: Linear Feedback Shift Register (LFSR) and Cellular Automata (CA), used for test pattern generation and test response analysis in a typical
Results 1 - 10
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4,835
