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Test pattern generation using Boolean satisfiability
- IEEE Transactions on Computer-Aided Design
, 1992
"... Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted ..."
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Abstract-This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted
