• Documents
  • Authors
  • Tables
  • Log in
  • Sign up
  • MetaCart
  • DMCA
  • Donate

CiteSeerX logo

Advanced Search Include Citations

Tools

Sorted by:
Try your query at:
Semantic Scholar Scholar Academic
Google Bing DBLP
Results 1 - 10 of 30,176
Next 10 →

AUTOMATIC TEST EQUIPMENT

by Model Serial, No. Rev No, Kepco Inc
"... 1) This manual is valid for the following Model and associated serial numbers: ..."
Abstract - Add to MetaCart
1) This manual is valid for the following Model and associated serial numbers:

AN INTELLIGENT APPROACH TO AUTOMATIC TEST EQUIPMENT

by unknown authors
"... In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate within the context of a situation. Instead, testing follows a rigid, predetermined, fault-isolation sequence that is based o ..."
Abstract - Add to MetaCart
, does not require a trained technician to build the knowledge base. This new approach is model-based and has evolved over the last 10 years. This evolution has led to the development of several maintenance tools and an architecture for intelligent automatic test equipment (ATE). The architecture has

Automatic Test Equipment and Test Information

by All Rights Reserved , 2005
"... Markup Language (ATML) for Exchanging ..."
Abstract - Add to MetaCart
Markup Language (ATML) for Exchanging

Automatic Test Equipment Pin Electronics

by unknown authors
"... digital-to-analog converters with 8 to 40 channels, offering 12-bit to 16-bit resolution. Key Features • High density of D/A channels • Uncompromised performance in a small footprint • User-programmable flexible features ..."
Abstract - Add to MetaCart
digital-to-analog converters with 8 to 40 channels, offering 12-bit to 16-bit resolution. Key Features • High density of D/A channels • Uncompromised performance in a small footprint • User-programmable flexible features

Automatic Test Equipment Pin Electronics

by unknown authors
"... digital-to-analog converters with 8 to 40 channels, ..."
Abstract - Add to MetaCart
digital-to-analog converters with 8 to 40 channels,

Automatic Test Equipment Pin Electronics

by unknown authors
"... digital-to-analog converters with 8 to 40 channels, offering 12-bit to 16-bit resolution. Key Features • High density of D/A channels • Uncompromised performance in a small footprint • User-programmable flexible features ..."
Abstract - Add to MetaCart
digital-to-analog converters with 8 to 40 channels, offering 12-bit to 16-bit resolution. Key Features • High density of D/A channels • Uncompromised performance in a small footprint • User-programmable flexible features

1Timing Generator for the Application of the Automatic Test Equipment

by Chun-min Yang
"... Timing generator is an important building block in Auto Test Equipment (ATE). Conventionally, it is implemented by a mixture of semiconductor technologies such as ECL or GaAs. Today, for the cost and power consumption reduction, CMOS technology is an attractive alternative. With performance improvem ..."
Abstract - Add to MetaCart
Timing generator is an important building block in Auto Test Equipment (ATE). Conventionally, it is implemented by a mixture of semiconductor technologies such as ECL or GaAs. Today, for the cost and power consumption reduction, CMOS technology is an attractive alternative. With performance

Instrumentation Amplifier Current Sense Amplifier Video Difference Amplifier Automatic Test Equipment

by Gain Range To, Gain Range To, Applicatio S
"... The LT ® 1995 is a high speed, high slew rate, gain selectable amplifier with excellent DC performance. Gains from –7 to 8 with a gain accuracy of 0.2 % can be achieved using no external components. The device is particularly well suited for use as a difference amplifier, where the excellent resisto ..."
Abstract - Add to MetaCart
The LT ® 1995 is a high speed, high slew rate, gain selectable amplifier with excellent DC performance. Gains from –7 to 8 with a gain accuracy of 0.2 % can be achieved using no external components. The device is particularly well suited for use as a difference amplifier, where the excellent resistor matching results in a typical common mode rejection ratio of 79dB. The amplifier is a single gain stage design similar to the LT1363 and features superb slewing and settling characteristics. Input offset of the internal operational amplifier is less than 2.5mV and the slew rate is 1000V/µs. The output can drive a 150Ω load to ±2.5V on ±5V supplies, making it useful in cable driver applications. The resistors have excellent matching, 0.2 % maximum at room temperature and 0.3 % from –40°C to 85°C. The temperature coefficient of the resistors is typically –30ppm/°C. The resistors are extremely linear with voltage, resulting in a gain nonlinearity of 10ppm. The LT1995 is fully specified at ±2.5V, ±5V and ±15V supplies and from –40°C to 85°C. The device is available in space saving 10-lead MSOP and 10-Lead (3mm × 3mm) DFN packages. For a micropower precision amplifier with precision resistors, see the LT1991 and LT1996.

KLEE: Unassisted and Automatic Generation of High-Coverage Tests for Complex Systems Programs

by Cristian Cadar, Daniel Dunbar, Dawson Engler
"... We present a new symbolic execution tool, KLEE, capable of automatically generating tests that achieve high coverage on a diverse set of complex and environmentally-intensive programs. We used KLEE to thoroughly check all 89 stand-alone programs in the GNU COREUTILS utility suite, which form the cor ..."
Abstract - Cited by 557 (15 self) - Add to MetaCart
We present a new symbolic execution tool, KLEE, capable of automatically generating tests that achieve high coverage on a diverse set of complex and environmentally-intensive programs. We used KLEE to thoroughly check all 89 stand-alone programs in the GNU COREUTILS utility suite, which form

Controlled and automatic human information processing: II. Perceptual learning, automatic attending and a general theory

by Richard M. Shiffrin, Walter Schneider - Psychological Review , 1977
"... The two-process theory of detection, search, and attention presented by Schneider and Shiffrin is tested and extended in a series of experiments. The studies demonstrate the qualitative difference between two modes of information processing: automatic detection and controlled search. They trace the ..."
Abstract - Cited by 845 (12 self) - Add to MetaCart
The two-process theory of detection, search, and attention presented by Schneider and Shiffrin is tested and extended in a series of experiments. The studies demonstrate the qualitative difference between two modes of information processing: automatic detection and controlled search. They trace
Next 10 →
Results 1 - 10 of 30,176
Powered by: Apache Solr
  • About CiteSeerX
  • Submit and Index Documents
  • Privacy Policy
  • Help
  • Data
  • Source
  • Contact Us

Developed at and hosted by The College of Information Sciences and Technology

© 2007-2019 The Pennsylvania State University