• Documents
  • Authors
  • Tables
  • Log in
  • Sign up
  • MetaCart
  • DMCA
  • Donate

CiteSeerX logo

Tools

Sorted by:
Try your query at:
Semantic Scholar Scholar Academic
Google Bing DBLP
Results 1 - 10 of 181,911
Next 10 →

Table 4-3. Ir thin film e-beam conditions. Target Ir (purity: 99.9%)

in Fabrication and characterisation of ferroelectric lead . . .
by Serhiy Matichyn
"... In PAGE 10: ... Representative volatile MOCVD precursors used in PZT thin-film deposition and their vaporization properties. 28 Table4 -1. Deposition conditions of bismuth oxide and strontium tantalate oxide thin films.... In PAGE 10: ... Deposition conditions of bismuth oxide and strontium tantalate oxide thin films. 34 Table4 -2. Deposition conditions of SBT thin films.... In PAGE 10: ... Deposition conditions of SBT thin films. 37 Table4 -3. Ir thin film e-beam conditions.... In PAGE 46: ... The deposition conditions are summarized in table 4-1. Table4 -1. Deposition conditions of bismuth oxide and strontium tantalate oxide thin films.... In PAGE 49: ... The deposition conditions are summarized in table 4-2. Table4 -2. Deposition conditions of SBT thin films.... ..."

Table I. Retrieved thickness and quadratic error resulting from the minimization process on H-free and hydrogenated amorphous silicon thin films. The experimental thickness col- umn indicates values either estimated from deposition rate and deposition time, or estimated from profilometer data As indicated, the FFM method has been used for the retrieval of the properties of films with thickness less than 100 nm. Instead, the PUM method has been applied to films with d gt;100 nm.

in amorphous
by I. Chambouleyron A, S. D. Ventura B, E. G. Birgin C, J. M. Martínez B, I. Chambouleyron

Table I. Retrieved thickness and quadratic error resulting from the minimization process on H-free and hydrogenated amorphous silicon thin films. The experimental thickness col- umn indicates values either estimated from deposition rate and deposition time, or estimated from profilometer data As indicated, the FFM method has been used for the retrieval of the properties of films with thickness less than 100 nm. Instead, the PUM method has been applied to films with d gt;100 nm.

in amorphous
by I. Chambouleyron A, S. D. Ventura B, E. G. Birgin C, J. M. Martínez B, I. Chambouleyron

Table 1. Properties of Polymer Thin Films

in unknown title
by unknown authors
"... In PAGE 6: ... This report will provide descriptions of the material, test plan, and test methods and compare results as a function of material type and exposure condition. Materials The materials in this study, listed in Table1 , were all commercially available thin film polymers employed for numerous industrial applications, including protective surface coatings and food packaging. The Kapton, Metallized Mylar, and Tedlar films all were manufactured by DuPont.... ..."

Table 1. Properties of Polymer Thin Films

in NASA/CR-2003-212422 Characterization of Thin Film Polymers Through Dynamic Mechanical Analysis and Permeation
by Technical Publication Reports, Helen M. Herring
"... In PAGE 6: ... This report will provide descriptions of the material, test plan, and test methods and compare results as a function of material type and exposure condition. Materials The materials in this study, listed in Table1 , were all commercially available thin film polymers employed for numerous industrial applications, including protective surface coatings and food packaging. The Kapton, Metallized Mylar, and Tedlar films all were manufactured by DuPont.... ..."

Table 2-1. Thin film properties of PZT and SBT families.

in Fabrication and characterisation of ferroelectric lead . . .
by Serhiy Matichyn
"... In PAGE 10: ...List of Tables List of Tables Table2 -1. Thin film properties of PZT and SBT families.... ..."

Table 2. Thin Film Tensile Properties at Room Temperature

in Polyimides Containing Fluorine And Phosphorus For Potential Space Applications
by John Connell And, John W. Connell, Kent A. Watson
"... In PAGE 2: ... Polymers prepared from PMDA and BPDA gave relatively dark orange films. Thin film mechanical properties are presented in Table2 . The films exhibited room temperature tensile strengths and moduli from 79-122 MPa and 2.... ..."

Table 2. Thin Film Tensile Properties at Room Temperature

in Space Environmentally Stable Polyimides And Copolyimides
by Kent Watson And, Kent A. Watson, John W. Connell
"... In PAGE 9: ... Polymers prepared from PMDA and BPDA gave relatively dark orange films. Thin film mechanical properties are presented in Table2 . The films exhibited room temperature tensile strengths and moduli from 79-122 MPa and 2.... ..."

Table 2. Thin Film Tensile Properties at Room Temperature

in Space Environmentally Stable Polyimides And Copolyimides
by Kent A. Watson, John W. Connell
"... In PAGE 9: ... Polymers prepared from PMDA and BPDA gave relatively dark orange films. Thin film mechanical properties are presented in Table2 . The films exhibited room temperature tensile strengths and moduli from 79-122 MPa and 2.... ..."

Table 2. Thin Film Tensile Properties at Room Temperature

in Polyimides Containing Fluorine And Phosphorus For Potential Space Applications
by National Aeronautics And, John W. Connell, Kent A. Watson
"... In PAGE 2: ... Polymers prepared from PMDA and BPDA gave relatively dark orange films. Thin film mechanical properties are presented in Table2 . The films exhibited room temperature tensile strengths and moduli from 79-122 MPa and 2.... ..."
Next 10 →
Results 1 - 10 of 181,911
Powered by: Apache Solr
  • About CiteSeerX
  • Submit and Index Documents
  • Privacy Policy
  • Help
  • Data
  • Source
  • Contact Us

Developed at and hosted by The College of Information Sciences and Technology

© 2007-2019 The Pennsylvania State University