Gate Sizing Using Incremental Parameterized Statistical Timing Analysis

Gate Sizing Using Incremental Parameterized Statistical Timing Analysis (2005)

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by M. R. Guthaus , N. Venkateswaran , C. Visweswariah , V. Zolotov

Venue:	In ICCAD
Citations:	24 - 1 self

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Datum	Value	Source
TITLE	Gate Sizing Using Incremental Parameterized Statistical Timing Analysis	SVM HeaderParse 0.2
AUTHOR NAME	M. R. Guthaus	SVM HeaderParse 0.2
AUTHOR AFFIL	∗ Department of EECS, University of Michigan, Ann Arbor	SVM HeaderParse 0.2
AUTHOR ADDR	MI 48109	SVM HeaderParse 0.2
AUTHOR NAME	N. Venkateswaran	SVM HeaderParse 0.2
AUTHOR AFFIL	† IBM Systems & Technology Group, Hopewell Junction	SVM HeaderParse 0.2
AUTHOR ADDR	NY 12533	SVM HeaderParse 0.2
AUTHOR NAME	C. Visweswariah	SVM HeaderParse 0.2
AUTHOR AFFIL	‡ IBM T.J. Watson Research Center	SVM HeaderParse 0.2
AUTHOR ADDR	Yorktown Heights, NY 10598	SVM HeaderParse 0.2
AUTHOR NAME	V. Zolotov	SVM HeaderParse 0.2
AUTHOR AFFIL	‡ IBM T.J. Watson Research Center	SVM HeaderParse 0.2
AUTHOR ADDR	Yorktown Heights, NY 10598	SVM HeaderParse 0.2
ABSTRACT	Abstract — As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as statistical distributions during both analysis and optimization. This paper uses incremental, parametric statistical static timing analysis (SSTA) to perform gate sizing with a required yield target. Both correlated and uncorrelated process parameters are considered by using a first-order linear delay model with fitted process sensitivities. The fitted sensitivities are verified to be accurate with circuit simulations. Statistical information in the form of criticality probabilities are used to actively guide the optimization process which reduces run-time and improves area and performance. The gate sizing results show a significant improvement in worst slack at 99.86 % yield over deterministic optimization. I.	SVM HeaderParse 0.2
YEAR	2005	INFERENCE
VENUE	In ICCAD	INFERENCE
VENUE TYPE	CONFERENCE	INFERENCE
PAGES	1029--1036	INFERENCE
CITATIONS	20 found	ParsCit 1.0