Detecting Delay Faults Using Power Supply Transient Signal Analysis (2001)
| Venue: | IEEE Proceedings of International Test Conference |
| Citations: | 8 - 2 self |
BibTeX
@INPROCEEDINGS{Singh01detectingdelay,
author = {Abhishek Singh and Chintan Patel and Shirong Liao and Jim Plusquellic and Anne Gattiker},
title = {Detecting Delay Faults Using Power Supply Transient Signal Analysis},
booktitle = {IEEE Proceedings of International Test Conference},
year = {2001},
pages = {704--712}
}
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Abstract
A delay-fault testing strategy based on the analysis of power supply transient signals is presented. The method is an extension to a Go/No-Go device testing method called Transient Signal Analysis (TSA) [1]. TSA detects defects through the analysis of a set of power supply transient waveforms in the time or frequency domain, e.g., Fourier phase components. A recent extension to TSA demonstrated a correlation between the V DDT Fourier phase components and path delays in defect-free devices [2]. The method proposed here is able to detect increases in delay due to resistive shorting and open defects using a similar technique. In particular, simulation results show that a delay defective device can be distinguished from a defect-free device through an anomaly in the Fourier phase
