Statistical timing analysis considering spatial correlations using a single PERT-like traversal (2003)
| Citations: | 136 - 9 self |
BibTeX
@INPROCEEDINGS{Chang03statisticaltiming,
author = {Hongliang Chang and Sachin S},
title = {Statistical timing analysis considering spatial correlations using a single PERT-like traversal},
booktitle = {},
year = {2003},
pages = {621--625}
}
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Abstract
We present an efficient statistical timing analysis algorithm that predicts the probability distribution of the circuit delay while incorporating the effects of spatial correlations of intra-die parameter variations, using a method based on principal component analysis. The method uses a PERT-like circuit graph traversal, and has a run-time that is linear in the number of gates and interconnects, as well as the number of grid partitions used to model spatial correlations. On average, the mean and standard deviation values computed by our method have errors of ¢¤ £ ¥§ ¦ and ¢¨ £ ©� ¦ , respectively, in comparison with a Monte Carlo simulation. 1.
Citations
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| 40 | False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation - Liou, Krstic, et al. - 2002 |
| 39 | Statistical timing analysis using bounds and selective enumeration - Agarwal, Zolotov, et al. - 2003 |
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| 29 | Statistical Delay Calculation: A Linear Time Method - Berkelaar - 1997 |
| 21 | Path-based Statistical Timing Analysis Considering Inter and Intra-die Correlations - Agarwal, Blaauw, et al. - 2002 |
| 16 | Timing Analysis of Combinational Circuits Including Capacitive Coupling and - Choi, Walker - 2000 |
| 4 | Timing Yield Calculation Using an Impulse-Train Approach - Naidu - 2002 |
| 2 | A New Statistical Static Timing Analyzer Considering Correlation Between Delays - Tsukiyama, Tanaka, et al. - 2000 |
