Abstract

Compressed Sensing (CS) is a relatively new approach to signal acquisition which has as its goal to minimize the number of measurements needed of the signal in order to guarantee that it is captured to a prescribed accuracy. It is natural to inquire whether this new subject has a role to play in Electron Microscopy (EM). In this paper, we shall describe the foundations of Compressed Sensing and then examine which parts of this new theory may be useful in EM.