Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults (1998)
| Venue: | Proc of the 1998 Design Automation and Test in Europe |
| Citations: | 3 - 0 self |
BibTeX
@INPROCEEDINGS{Lindermeir98analogtest,
author = {Walter M. Lindermeir and Thomas J. Vogels and Helmut E. Graeb},
title = {Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults},
booktitle = {Proc of the 1998 Design Automation and Test in Europe},
year = {1998}
}
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Abstract
Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its e#ectiveness.
