A Virtual Test-Bench for Analog Circuit Testability Analysis and Fault Diagnosis (1998)
| Citations: | 4 - 1 self |
BibTeX
@MISC{Chakrabarty98avirtual,
author = {Sumangal Chakrabarty and Vivek Rajan and Jie Ying and Maya Mansjur and Krishna Pattipati and Somnath Deb and Prof Krishna Pattipati and Dr. Somnath Deb},
title = {A Virtual Test-Bench for Analog Circuit Testability Analysis and Fault Diagnosis},
year = {1998}
}
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Abstract
Are fault simulation techniques feasible and effective for fault diagnosis of analog circuits ? In this paper, we investigate these issues via a software tool which can generate testability metrics and diagnostic information for analog circuits represented by SPICE descriptions. This tool, termed the Virtual Test-Bench (VTB), incorporates three different simulation-based techniques for fault detection and isolation. The first method is based on the creation of fault-test dependency models, while the other two techniques employ machine learning principles based on the concepts of: (1) Restricted Coloumb Energy (RCE) Neural Networks, and (2) Learning Vector Quantization (LVQ). Whereas the output of the first method can be used for the traditional off-line diagnosis, the RCE and LVQ models render themselves more naturally to on-line monitoring, where measurement data from various sensors is continuously available. Since it is well known that analog faults and test measurements are affecte...
