Testability of 2-Level AND/EXOR Circuits (1997)
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| Venue: | in European Design & Test Conf |
| Citations: | 1 - 0 self |
BibTeX
@INPROCEEDINGS{Drechsler97testabilityof,
author = {Rolf Drechsler and Harry Hengster and Horst Schäfer and Joachim Hartmann and Bernd Becker},
title = {Testability of 2-Level AND/EXOR Circuits},
booktitle = {in European Design & Test Conf},
year = {1997}
}
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Abstract
It is often stated that AND#EXOR circuits are much easier testable than AND#OR circuits. This statement only holds for restricted classes of AND#EXOR expressions# like positive polarity Reed# Muller expressions and #xed polarity Reed#Muller ex# pressions. For these two classes of circuits good deter# ministic testability properties are known. In this paper we show that for these circuits also good random pat# tern testability can be proven. An input probability distribution is given which yields a short expected test length for biased random patterns. This is the #rst time that theoretical results on random pattern testa# bility arepresented for 2#level AND#EXOR circuit re# alizations of arbitrary Boolean functions. For more general classes of 2#level AND#EXOR circuits analogous results are not proven. We present experimental results that show that in general mini# mized 2#level AND#OR circuits are as well #or badly# testable as minimized 2#level AND#EXOR circuits. 1 Introduction M...
