A Design Experiment For Measurement Of The Spectral Content Of Substrate Noise In Mixed-Signal Integrated Circuits (1999)
by
Marc Van Heijningen
,
John Compiet
,
Piet Wambacq
,
Stéphane Donnay vIvo Bolsens
,
Stéphane Donnay
,
Ivo Bolsens
| Venue: | in Mixed-Signal Integrated Circuits”, 1999 Southwest Symposium on Mixed-Signal Design |
| Citations: | 5 - 3 self |







