A Design Experiment For Measurement Of The Spectral Content Of Substrate Noise In Mixed-Signal Integrated Circuits (1999)

by Marc Van Heijningen , John Compiet , Piet Wambacq , Stéphane Donnay vIvo Bolsens , Stéphane Donnay , Ivo Bolsens
Venue:in Mixed-Signal Integrated Circuits”, 1999 Southwest Symposium on Mixed-Signal Design
Citations:5 - 3 self