Randomness-efficient Low Degree Tests and Short PCPs via Epsilon-Biased Sets

Randomness-efficient Low Degree Tests and Short PCPs via Epsilon-Biased Sets (2003)

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by Eli Ben-Sasson , Madhu Sudan , Salil Vadhan , Avi Wigderson

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@MISC{Ben-Sasson03randomness-efficientlow,
    author = {Eli Ben-Sasson and Madhu Sudan and Salil Vadhan and Avi Wigderson},
    title = {Randomness-efficient Low Degree Tests and Short PCPs via Epsilon-Biased Sets },
    year = {2003}
}

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