The Effects of Over and Under Sampling on Fault-prone Module Detection (2007)
by
Yasutaka Kamei
,
Akito Monden
,
Shinsuke Matsumoto
,
Takeshi Kakimoto
,
Ken-ichi Matsumoto
| Venue: | FIRST INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT |
| Citations: | 2 - 1 self |







