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Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

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by Michael A. Bajura , Younes Boulghassoul , Riaz Naseer , Student Member , Eepan Dasgupta , Student Member , Arthur F. Witulski , Senior Member , Jeff Sondeen , Scott D. Stansberry , Jeffrey Draper , Lloyd W. Massengill , John N. Damoulakis
Venue:IEEE Trans. Nuclear Science
Citations:6 - 1 self