A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits (2002)
BibTeX
@MISC{Hoffmann02anew,
author = {Christoph Hoffmann},
title = {A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits},
year = {2002}
}
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Abstract
For the generation of defect-oriented tests a system is developed that includes the synthesis of self-test structures. With the objective to generate a highly efficient analogue test, the fault simulation methods are greatly enhanced: (1) A new testability measure, (2)the possibility to distinguish between not-to-detect and hard-to-detect faults with respect to the tolerances of the respective measurement system. By presenting a new design flow and using the fault simulation in a very early design stage a tool-suite is developed. It allows to control the defect-robust layout and to eliminate those faults that limit the efficiency of a measurement system. This allows for economic self-test applications! It is demonstrated that the system finds the most efficient and less expense test for a given fault set. With the presented results it is possible to include the defect-oriented approach from the fault simulation to the automatic generation of layout rules and the test synthesis in an industrial design flow.
