A Study of Multiple-Valued Magnetoresistive RAM (MRAM) Using Binary MTJ Devices (2004)
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http://www.eecg.toronto.edu/~ali/papers/ismvl2004.
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http://www.eecg.toronto.edu/~pagiamt/pubs/pagiamtz
http://www.eecg.toronto.edu/~ali/papers/ismvl2004.
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by
Hiromitsu Kimura
,
Kostas Pagiamtzis
,
Ali Sheikholeslami
,
Takahiro Hanyu
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Abstract:
This paper presents four-valued magnetoresistive RAM (MRAM) storage cells using one access transistor and two binary magnetic tunnel junction (MTJ) devices with the MTJ devices either in series or in parallel. We present a comparative study of the two cells in terms of their area and power benefits over the binary MRAM, all using the same conventional MRAM process.
Citations
| 4 | A 256kb 3.0v 1T1MTJ nonvolatile magnetoresistive RAM – Naji, Durlam, et al. - 2001 |
| 2 | Proposal of four-valued MRAM based on MTJ/RTD structure – Uemura, Yamamoto - 2003 |
| 2 | Magnetoresistive random access memory using magnetic tunnel junctions – Tehrani, Slaughter, et al. - 2003 |
| 1 | et al., “Magnetoresistive random access memory using magnetic tunnel junctions – Tehrani, Slaughter, et al. - 2003 |
| 1 | et al., “High-performance MRAM technology with an improved magnetic tunnel junction material – Motoyoshi, Moriyama, et al. |
| 1 | et al., “A low power 1Mbit MRAM based on IT1MTJ bit cell integrated with copper interconnects – Durlam, Naji, et al. |
| 1 | Proposal of four-valued MRAMbasedonMTJ/RTDstructure,”inIEEE – Uemura, Yamamoto |
| 1 | low power 1Mbit MRAM based on IT1MTJ bit cell integrated with copper interconnects – Durlam, Omair |

