On Y-compatible and strict Y-compatible functions (1997)


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by Bojan Hvala , Sandi Klavzar , Franc Novak , A Function F Ir
Citations:1 - 1 self

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5 Model-Based Analogue Circuit Diagnosis with CLP(R) – Igor Mozetic, Christian Holzbaur, Iskra Hipot
6 Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits – C. Sebeke, J. P. Teixeira, M. J. Ohletz - 1995
Fault Emulation: Reconfigurable Hardware-Based Fault Simulation Using Logic Emulation Systems with Optimized Mapping – Reza Sedaghat - 1999
2 Low cost test of embedded RF/analog/mixed-signal circuits in SOPs – S. S. Akbay, A. Halder, A. Chatterjee, D. Keezer - 2004
TABLE OF CONTENTS – unknown authors
16 Comparison of Basis Selection Methods – J. Adler, B. D. Rao, K. Kreutz-delgado - 1996
79 An affine scaling methodology for best basis selection – Bhaskar D. Rao, Senior Member, Kenneth Kreutz-delgado, Senior Member - 1999
Machine Learning Algorithms for Fault Diagnosis in Analog Circuits – Vivek Rajan, Jie Ying, Sumangal Chakrabarty, Prof Krishna Pattipati
Diagnosing Analog Circuits Designed-for-Testability by Using CLP(R) – Igor Mozetic, Franc Novak, Marina Santo-zarnik, Anton Biasizzo - 1993
Evaluation of i DD /v OUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits – J. Machado Da Silva, J. Silva Matos - 1996
4 Realistic Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits – Michael J. Ohletz - 1996
5 Enhancing Design-for-Test for Active Analog Filters by Using CLP(R) – Franc Novak, Anton Biasizzo, Igor Mozetic, Marina Santo-Zarnik - 1994
1 Automatic Test Generation for Maximal Diagnosis of Linear Analog Circuits – S. Mir, M. Lubaszewski, V. Kolarik, B. Courtois - 1996
On Analog Signature Analysis Franc Novak – Jožef Stefan, Bojan Hvala, I Klavžar
SUBMITTED TO IEEE TRANS. ON SIGNAL PROCESSING 1 Fault Identification via Non-parametric Belief Propagation – Danny Bickson, Dror Baron, Senior Member, Er Ihler, Harel Avissar, Student Member, Danny Dolev
A Tool for Single Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-vector Approach – José A. Soares Augusto, et al. - 2007
7 An Aggressive Approach to Parameter Extraction – Mohamed H. Bakr, John W. Bandler, Student Member, John W. B, Natalia Georgieva - 1999
4 A Virtual Test-Bench for Analog Circuit Testability Analysis and Fault Diagnosis – Sumangal Chakrabarty, Vivek Rajan, Jie Ying, Maya Mansjur, Krishna Pattipati, Somnath Deb, Prof Krishna Pattipati, Dr. Somnath Deb - 1998