Functional test generation for synchronous sequential circuits (1996)

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by M. K. Srinivas , James Jacob , Vishwani D. Agrawal
Venue:IEEE Trans. on CAD/ICAS
Citations:2 - 0 self

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Functional Test Generait ion for Non-Scan Sequential Circuits – M. K. Srinivas, James Jacob, Vishwani D. Agrawal
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A Complete Testing Strategy Based on Interacting and Hierarchical FSMs – F. Fummi, D. Sciuto
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