This paper describes Glitchless, a circuit-level technique for reducing power in FPGAs by eliminating unnecessary logic transitions called glitches. This is done by adding programmable delay elements to the logic blocks of the FPGA. After routing a circuit and performing static timing analysis, these delay elements are programmed to align the arrival times of the inputs of each LUT, thereby preventing new glitches from being generated. Moreover, the delay elements also behave as filters that eliminate other glitches generated by upstream logic or off-chip circuitry. On average, the proposed implementation eliminates 87 % of the glitching, which reduces overall FPGA power by 17%. The added circuitry increases the overall FPGA area by 6 % and critical-path delay by less than 1%. Furthermore, since it is applied after routing, the proposed technique requires little or no modifications to the routing architecture or CAD flow.

Reconfigurable circuits running in Field Programmable Gate Arrays (FPGAs) can be dynamically optimized for power based on computational requirements and thermal conditions of the environment. In the past, FPGA circuits were typically small and operated at a low frequency. Few users were concerned about high-power consumption and the heat generated by FPGA devices. The current generation of FPGAs, however, use extensive pipelining techniques to achieve high data processing rates and dense layouts that can generate significant amounts of heat. FPGA circuits can be synthesized that can generate more heat than the package can dissipate. For FPGAs that operate in controlled environments, heatsinks and fans can be mounted to the device to extract heat from the device. When FPGA devices do not operate in a controlled environment, however, changes to ambient temperature due to factors such as the failure of a fan or a reconfiguration of bitfile running on the device can drastically change the operating conditions. A protection mechanism is needed to ensure the proper operation of the FPGA circuits when such a change occurs. To address these issues, we have devised a reconfigurable temperature monitoring system that gives feedback to the FPGA circuit using the measured junction temperature of the device. Using this feedback, we designed a novel dual frequency switching system that allows the FPGA circuits to maintain the highest level of performance for a given maximum junction temperature. Our working system has been implemented and deployed on the Field Programmable Port Extender (FPX) platform at Washington University in St. Louis. Our experimental results with a scalable image correlation circuit show up to a 2.4x factor increase in performance as compared to a system withou...

I hereby declare that I am the sole author of this thesis. This is a true copy of the thesis, including any required final revisions, as accepted by my examiners. I understand that my thesis may be made electronically available to the public. The Advanced Encryption Standard (AES) was developed by Joan Daemen and Vincent Rjimen and endorsed by the National Institute of Standards and Technology in 2001. It was designed to replace the aging Data Encryption Standard (DES) and be useful for a wide range of applications with varying throughput, area, power dissipation and energy consumption requirements. Field Programmable Gate Arrays (FPGAs) are flexible and reconfigurable integrated circuits that are useful for many different applications including the implementation of AES. Though they are highly flexible, FPGAs are often less efficient than Application Specific Integrated Circuits (ASICs); they tend to operate slower, take up more space and dissipate more power. There have been many FPGA AES implementations that focus on obtaining high throughput or low area usage, but very little research done in the area of low power or energy efficient FPGA based AES; in fact, it is rare for estimates on power dissipation to be made at all.

The paper presents an overview of a major research project on dependable embedded systems that has started in Fall 2010 and is running for a projected duration of six years. Aim is a ‘dependability co-design ’ that spans various levels of abstraction in the design process of embedded systems starting from gate level through operating system, applications software to system architecture. In addition, we present a new classification on faults, errors, and failures.