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- IEEE Transactions On Semiconductor Manufacturing , 1997
"... ..."(Show Context)
"... Towards predictable deep-submicron manufacturing ..."(Show Context)
|Venue:||IEEE Trans. Circuits Syst|
...is dependent on a controlled alteration of the random generation of the input instances. Importance sampling ,  forces more samples in regions where yield is close to 50%. Parametric sampling =-=-=- allows samples froms446 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, VOL. 10, NO. 4, NOVEMBER 1997 previous circuit designs to be added to samples for more recent versions. Stratified sampling [...
...sign centring presented by  bears some similarity with our own approach. Implicit methods of yield optimisation do not attempt to construct an approximation of the feasible region. For example in =-=-=-, parametric sampling is used as the basis for design centring. The feasible region is usually known as the solution of a set of analytical equations, and implicit methods are content with merely bein...
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