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14
True Minimum Energy Design Using Dual Below-Threshold Supply Voltages
- INTERNATIONAL CONFERENCE ON VLSI DESIGN
, 2011
"... This paper investigates subthreshold voltage operation of digital circuits. The minimum energy per cycle operating point with a single voltage for this mode is known. We further lower the energy per cycle below that point by using dual subthreshold supplies. We call this the true minimum. Special co ..."
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Cited by 7 (6 self)
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This paper investigates subthreshold voltage operation of digital circuits. The minimum energy per cycle operating point with a single voltage for this mode is known. We further lower the energy per cycle below that point by using dual subthreshold supplies. We call this the true minimum. Special considerations are used in the design for eliminating level converters. We give new mixed integer linear programs (MILP) that automatically and optimally assign gate voltages, avoid the use of level converters, and determine and hold the minimum critical path delay, while minimizing the total energy per cycle. Using examples of a 16-bit ripple-carry adder and a 4 × 4 multiplier we show energy savings of 23 % and 5%, respectively. The latter is a worst case example because most paths are critical. Alternatively, for the same energy as that of single below-threshold supply, an optimized dual voltage design can operate at 3 to 4 times higher clock rate. The MILP optimization with special consideration for level converters is general and applicable to any supply voltage range.
Minimum Energy CMOS Design with Dual Subthreshold Supply and Multiple Logic-Level Gates
"... Abstract—This paper presents a method for minimum energy digital CMOS circuit design using dual subthreshold supply voltages. Stringent energy budget and moderate speed requirements of some ultra low power systems may not be best satisfied just by scaling a single supply voltage. Optimized circuits ..."
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Cited by 7 (5 self)
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Abstract—This paper presents a method for minimum energy digital CMOS circuit design using dual subthreshold supply voltages. Stringent energy budget and moderate speed requirements of some ultra low power systems may not be best satisfied just by scaling a single supply voltage. Optimized circuits with dual supply voltages provide an opportunity to resolve these demands. The delay penalty of a traditional level converter is unacceptably high when the voltages are in the subthreshold range. In the present work level converters are not used and special multiple logic-level gates are used only when, after accounting for their cost, they offer advantage. Starting from a lowest per cycle energy design whose single supply voltage is in the subthreshold range, a new mixed integer linear program (MILP) finds a second lower supply voltage optimally assigned to gates with time slack. The MILP accounts for the energy and delay characteristics of logic gates interfacing two different signal levels. New types of linearized AND and OR constraints are used in this MILP. We show energy saving up to 24.5 % over the best available designs of ISCAS’85 benchmark circuits. Keywords — Ultra-low power design, Subthreshold circuits, Dual voltage design, Mixed integer linear program.
Energy Source Lifetime Optimization for a Digital System through Power Management
"... Abstract—We examine the energy consumption of a digital circuit with voltage scaling and observe its impact on the energy efficiency of the battery. We study the system with a power source under throughput constraints and we propose a method to find a right size of battery to satisfy given system re ..."
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Cited by 5 (2 self)
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Abstract—We examine the energy consumption of a digital circuit with voltage scaling and observe its impact on the energy efficiency of the battery. We study the system with a power source under throughput constraints and we propose a method to find a right size of battery to satisfy given system requirements. For systems with limit on battery weight or volume, we suggest a right circuit voltage operating point. Maximizing battery lifetime, expressed in terms of clock cycles, depends upon a proper choice of the supply voltage and the corresponding clock frequency that the circuit would support. Analysis of various battries shows that when no system performance requirement is specified, the optimum operating supply can be in the subthreshold range. I.
A Tutorial on Battery Simulation- Matching Power Source to Electronic System
"... We use an electrical circuit model to simulate the performance of a battery as it powers the operation of a digital circuit. For a hypothetical electronic system containing 70 million gates implemented in 45nm CMOS technology the problem of finding a suitable battery is analyzed. The proposed three ..."
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Cited by 4 (2 self)
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We use an electrical circuit model to simulate the performance of a battery as it powers the operation of a digital circuit. For a hypothetical electronic system containing 70 million gates implemented in 45nm CMOS technology the problem of finding a suitable battery is analyzed. The proposed three part solution consists of (1) circuit simulation to determine critical path delay and average current as functions of supply voltage, (2) battery simulation to determine its efficiency and lifetime (time between recharges) at various current loads and to find suitable batteries for the electronic system, and (3) derivation of operational modes (supply voltages and clock frequencies) for maximum performance and minimum energy, respectively. 1.
Subthreshold Voltage High-k CMOS Devices Have Lowest Energy and High Process Tolerance
"... Abstract — Evolving nanometer CMOS technologies provide low power, high performance and higher levels of integration but suffer from increased subthreshold leakage and excessive process variation. The present work examines the 45nm bulk and high-k technologies. We evaluate the performance of a 32-bi ..."
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Cited by 2 (0 self)
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Abstract — Evolving nanometer CMOS technologies provide low power, high performance and higher levels of integration but suffer from increased subthreshold leakage and excessive process variation. The present work examines the 45nm bulk and high-k technologies. We evaluate the performance of a 32-bit ripplecarry adder circuit for the entire range of supply voltages over which it displays correct function. Lowering voltage increases delay, reducing the maximum clock cycle rate. We use the maximum permissible clock rate and the energy per cycle at that clock rate as two performance criteria. The minimum energy per cycle operation occurs at a subthreshold voltage. For minimum energy, the bulk technology has a very low performance (~7 MHz). However, high-k technology works at a much higher 250 MHz clock. Faster clock rate reduces the leakage energy making high-k almost twice as energy efficient compared to bulk. The energy per cycle versus supply voltage is a U-shaped curve whose bottom, the minimum energy point, provides a stable equilibrium against speed and energy deviations due to process related parametric variations for different technologies. These deviations can be expected to be lower for high k technology compared to those circuits designed in bulk technology that are commonly in use. These deviations are also lower compared to those at higher supply voltages that are commonly in use. Although we expect the clock rate to further improve and energy per cycle to reduce for 32 nm and finer technologies, some projections indicate that energy per cycle could increase with a move towards finer technologies. However, those studies were conducted on bulk technologies and further investigation should ascertain the performance of the high-k technology. Keywords – Low-power circuits, subthreshold voltage operation, nanometer CMOS devices, high-k CMOS technology, process variation.
Correlation Verification between Transistor Variability Model with Body Biasing and Ring Oscillation Frequency in 90nm Subthreshold Circuits
"... This paper presents modeling of manufacturing variability and body bias effect for subthreshold circuits based on measurement of a device array circuit in a 90nm technology. The device array consists of P/NMOS transistors and ring oscillators. This work verifies the correlation between the variation ..."
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Cited by 1 (1 self)
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This paper presents modeling of manufacturing variability and body bias effect for subthreshold circuits based on measurement of a device array circuit in a 90nm technology. The device array consists of P/NMOS transistors and ring oscillators. This work verifies the correlation between the variation model extracted from I-V measurement results and oscillation frequencies, which means the transistor-level variation model is examined and confirmed in terms of circuit performance. We demonstrate that delay variations of subthreshold circuits are well characterized with two parameters- threshold voltage and subthreshold swing parameter. We reveal that body bias effect is a less statistical phenomenon and threshold voltage shift by body biasing can be modeled deterministically.
Transistor Variability Modeling and its Validation With Ring-Oscillation Frequencies for Body-Biased Subthreshold Circuits
"... Abstract—This paper presents transistor variability modeling and its validation for body-biased subthreshold circuits based on measurements of a device-array circuit using a 90-nm technology. The device array consists of p/nMOS transistors and ring oscillators. We examine and confirm the correlation ..."
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Cited by 1 (0 self)
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Abstract—This paper presents transistor variability modeling and its validation for body-biased subthreshold circuits based on measurements of a device-array circuit using a 90-nm technology. The device array consists of p/nMOS transistors and ring oscillators. We examine and confirm the correlation between the performance variation model extracted from measured I-V characteristics and fabricated oscillation frequencies. We demonstrate that delay variations in subthreshold circuits are well characterized with two parameters, i.e., threshold voltage and subthreshold swing parameter. We also reveal that threshold voltage shift by body biasing can be deterministically modeled and statistical modeling is less meaningful. Index Terms—Body biasing, manufacturing variability, subthreshold circuit, threshold voltage, variability modeling. I.
Application-Specific Hardware Design for Wireless Sensor Network Energy and Delay Reduction ABSTRACT
"... Battery-powered embedded systems, such as wireless sensor network (WSN) motes, require low energy usage to extend system lifetime. WSN motes must power sensors, a processor, and a radio for wireless communication over long periods of time, and are therefore particularly sensitive to energy use. Rece ..."
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Battery-powered embedded systems, such as wireless sensor network (WSN) motes, require low energy usage to extend system lifetime. WSN motes must power sensors, a processor, and a radio for wireless communication over long periods of time, and are therefore particularly sensitive to energy use. Recent techniques for reducing WSN energy consumption, such as aggregation, require additional computation to reduce the cost of sending data by minimizing radio data transmissions. Larger demands on the processor will require more computational energy, but traditional energy reduction approaches, such as multi-core scaling with reduced frequency and voltage may prove heavy handed and ineffective for motes. Instead, application-specific hardware design (ASHD) architectures can reduce computational energy consumption by processing operations common to specific applications more efficiently than a general purpose processor. By the nature of their deeply embedded operation, motes support a limited set of applications, and thus the conventional general purpose computing paradigm may not be well-suited to mote operation. Both simple and complex operations can improve performance and use orders of magnitude less energy with application-specific hardware. This paper examines the design considerations of a hardware accelerator for compressed Bloom filters, a data structure for efficiently storing set membership. Additionally, we evaluate our ASHD design for three representative wireless sensor network applications: monitoring network-wide mote status, object tracking, and on-mote duplicate packet filtering. We demonstrate that ASHD design reduces network latency by 59 % and computational energy by 98%, and show the need for architecting processors for ASHD accelerators. 1.
Dual Voltage Design for Minimum Energy Using
"... Abstract—This paper presents a new slack-time based algorithm for dual Vdd design to achieve maximum energy saving. Although a global optimum is sought computation time is kept low. The slack of a gate is defined as the difference between the critical path delay for the circuit and the delay of the ..."
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Abstract—This paper presents a new slack-time based algorithm for dual Vdd design to achieve maximum energy saving. Although a global optimum is sought computation time is kept low. The slack of a gate is defined as the difference between the critical path delay for the circuit and the delay of the longest path through that gate. A linear-time algorithm is used for computing slacks for all gates of the circuit. Positive non-zero slack gates are classified into two groups, one in which all gates can be unconditionally assigned low voltage and the other where only a selected subset can be assigned low voltage without violating the positive non-zero slack requirement. Multiple voltage boundaries are given special consideration. The overall complexity of this power optimization algorithm is linear in number of gates as compared to a previously published exponential-time exact algorithm using mixed integer linear program (MILP). We apply the new algorithm to optimize ISCAS’85 benchmark circuits and compare the results with those from MILP. We avoid the use of level converters at multiple voltage boundaries. Energy savings from the new slack-time based algorithm is very closed to those from MILP. For c880, the energy saving is 22 % for subthreshold voltage operation and 50 % for nominal operation in PTM CMOS 90nm. For c2670 nominal voltage design, time of dual voltage optimization is reduced 44X compared to the MILP method. This new algorithm is beneficial for a large circuits with many large positive slack paths that would require enormous time for optimization by the MILP approach. I.
Appears in the 40th International Conference on Dependable Systems and Networks (DSN ’10) A Unified Model for Timing Speculation: Evaluating the Impact of Technology Scaling, CMOS Design Style, and Fault Recovery Mechanism
"... Due to fundamental device properties, energy efficiency from CMOS scaling is showing diminishing improvements. To overcome the energy efficiency challenges, timing speculation has been proposed to optimize for common-case timing conditions, with errors occurring under worst-case conditions detected ..."
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Due to fundamental device properties, energy efficiency from CMOS scaling is showing diminishing improvements. To overcome the energy efficiency challenges, timing speculation has been proposed to optimize for common-case timing conditions, with errors occurring under worst-case conditions detected and corrected in hardware. Although various timing speculation techniques have been proposed, no general framework exists for reasoning about the trade-offs and high-level design considerations of timing speculation. This paper develops two models to study the end-to-end behavior of timing speculation: a hardware-level efficiency model that considers the effects of process variations on path delays, and a complementary system-level recovery model. When combined, the models are used to assess the impact of technology scaling, CMOS design style, and fault recovery mechanism on the efficiency of timing speculation. Our results show that (1) efficiency gains from timing speculation do not improve as technology scales, (2) ultralow power (sub-threshold) CMOS designs benefit most from timing speculation – we report a 47 % potential energydelay reduction, and (3) fine-grained fault recovery is key to significant energy improvements. The combined model uses only high-level inputs to derive quantitative energy efficiency benefits without any need for detailed simulation, making it a potentially useful tool for hardware developers. 1.

