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SPFD-based wire removal in standard-cell and network-of-PLA circuits
- IEEE Transactions on ComputerAided Design of Integrated Circuits and Systems
, 2004
"... Abstract—Wire removal is a technique by which the total number of wires between individual circuit nodes is reduced, either by removing wires or replacing them with other new wires. The wire removal techniques we describe in this paper are based on both binary and multivalued sets of pairs of functi ..."
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Abstract—Wire removal is a technique by which the total number of wires between individual circuit nodes is reduced, either by removing wires or replacing them with other new wires. The wire removal techniques we describe in this paper are based on both binary and multivalued sets of pairs of functions to be distinguished (SPFDs). Recently, it was shown that a design style based on a multilevel network of approximately equal-sized programmable logic arrays (PLAs) results in a dense, fast, and crosstalk-resistant layout. This paper describes the application of SPFD-based wire removal techniques for circuit implementations utilizing networks of PLAs as well as standard-cells. In our first set of wire removal experiments (which utilize binary SPFD-based wire removal), we demonstrate that the benefit of SPFD-based wire removal is insignificant when the circuit is mapped using standard cells. We demonstrate that this technique is very effective
On the Minimization of Potential Transient Errors and SER in Logic Circuits using SPFD
"... Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises superiority in exploring the flexibility offered by a design over all previous representation methods. In this work, we ill ..."
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Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises superiority in exploring the flexibility offered by a design over all previous representation methods. In this work, we illustrate how the SPFD of a particular wire reveals information regarding the number of potential transient errors that may occur on that wire and may affect the output of the circuit. Using an SPFD-based rewiring method, we then demonstrate how to evolve a logic circuit in order to minimize the total number of potential transient errors in the circuit and, consequently, reduce its Soft Error Rate (SER) while controlling the effect on the rest of the design parameters, such as area, power, delay, and testability. Experimental results on ISCAS’89 and ITC’99 benchmark circuits indicate that the SER can be reduced at no additional overhead to any of the design parameters. 1
Seamless Integration of SER in Rewiring-Based Design Space Exploration
"... Rewiring has been used extensively for optimizing the area, the power consumption, the delay, and the testability of a circuit. In this work, we demonstrate how rewiring can also be used for reducing the Soft Error Rate (SER). We employ an ATPG-based rewiring method to generate functionally-equivale ..."
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Rewiring has been used extensively for optimizing the area, the power consumption, the delay, and the testability of a circuit. In this work, we demonstrate how rewiring can also be used for reducing the Soft Error Rate (SER). We employ an ATPG-based rewiring method to generate functionally-equivalent yet structurally-different implementations of a logic circuit based on simple transformation rules. This rewiring capability, along with an off-the-shelf method for assessing the SER of a circuit, enable the integration of the SER in a unified search algorithm that iteratively evolves the design in order to satisfy a given set of objectives. Experimental results on ISCAS’89 and ITC’99 benchmark circuits verify that rewiring can indeed be successfully used to reduce the SER of a circuit and, thus, it facilitates a design-space exploration framework for trading off area, power consumption, delay, testability, and SER. 1

