Analysis for Delay Defects and Noise Effects in Deep Submicron Devices (2003)

by J-J Liou, A Krstic, Y-M Jiang, K-T Cheng, Testing “Modeling
Venue:Proceedings of the Design, Automation and Test in Europe Conference and Exhibition (DATE’04) 1530-1591/04 $20.00 © 2004 IEEE