Detecting Delay Faults Using Power Supply Transient Signal Analysis (2001)

by A Singh, C Patel, S Liao, J Plusquellic, A Gattiker
Venue:IEEE Proceedings of International Test Conference
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I_DDX-Based Test methods: A Survey

by Sagar S. Sabade, Duncan M. Walker - ACM Trans. Design Automation of Electronic Systems , 2004
"... This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies ..."
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This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies

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by Abhishek Singh, Abhishek Singh, Jim Plusquellic, Dhananjay Phatak, Chintan Patel, Abhishek Singh, Jim Plusquellic, Chintan Patel
"... Defect Simulation Model for i DDT Testing ..."
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Defect Simulation Model for i DDT Testing