Dynamic Supply Current Testing of Analog Circuits Using Wavelet Transform (2002)

by S Bhunia, K Roy
Venue:In Proceedings of the IEEE VLSI Test Symposium, Monterey, CA (Apr
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I_DDX-Based Test methods: A Survey

by Sagar S. Sabade, Duncan M. Walker - ACM Trans. Design Automation of Electronic Systems , 2004
"... This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies ..."
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This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies