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I_DDXBased Test methods: A Survey
 ACM Trans. Design Automation of Electronic Systems
, 2004
"... This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep submicron (DSM) technologies ..."
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This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep submicron (DSM) technologies
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current
"... Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently test the frequency specification of analog filters. The pole/zero ..."
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Cited by 1 (1 self)
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Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently test the frequency specification of analog filters. The pole/zero locations in the frequency response of analog filters shift due to change in component values with process variations. It is essential to test the filters for the shift in frequency response and fix it, during production test. Wavelet analysis of supply current can be a promising alternative to test frequency specification of analog filters, since it needs only one ac stimulus and is virtually unaffected by transistor threshold variation. Simulation results on two test circuits demonstrate that we can estimate pole/zero shift with less than 3 % error using only one measurement, which requires about 18 measurements in the conventional technique.
Siva Yellampalli
"... I dedicate my work to my parents Mr. Nageswara Rao and Mrs. Vijaya Lakshmi, my brother and sisterin law Mr. Sapta Nag and Mrs. Parimala and my grandparents Mr. Gandhi and Mrs. Sambrajam for their constant support and encouragement throughout my life. I am very grateful to my advisor Dr. A. Srivasta ..."
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I dedicate my work to my parents Mr. Nageswara Rao and Mrs. Vijaya Lakshmi, my brother and sisterin law Mr. Sapta Nag and Mrs. Parimala and my grandparents Mr. Gandhi and Mrs. Sambrajam for their constant support and encouragement throughout my life. I am very grateful to my advisor Dr. A. Srivastava for his guidance, patience and understanding throughout this work. His suggestions and discussion helped me to get deep insight into the field of VLSI design and testing.
Responsible Editor: K. K. Saluja
, 2011
"... Abstract Test techniques for analog circuits characterize the inputoutput relationship based on coefficients of transfer function, polynomial expansion, wavelet transform, Vtransform or Volterra series. However, these coefficients always suffer from errors due to measurement accuracy and noise. Th ..."
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Abstract Test techniques for analog circuits characterize the inputoutput relationship based on coefficients of transfer function, polynomial expansion, wavelet transform, Vtransform or Volterra series. However, these coefficients always suffer from errors due to measurement accuracy and noise. This paper presents closed form expressions for an upper bound on the defect level and a lower bound on fault coverage achievable in such analog circuit test methods. The computed bounds have been validated on several benchmark circuits. Further, application of these bounds to scalable RC ladder networks reveal a number of interesting characteristics. The approach adopted here is general and can be extended to find bounds on defect level and fault coverage in other component based test methods for linear circuits.
Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Current
"... In recent years, Defect Oriented Testing (DOT) has been investigated as an alternative testing method for analog circuits. In this paper, we propose a wavelet transform based dynamic current (IDD) analysis technique for detecting catastrophic and parametric faults in analog circuits. Wavelet transfo ..."
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In recent years, Defect Oriented Testing (DOT) has been investigated as an alternative testing method for analog circuits. In this paper, we propose a wavelet transform based dynamic current (IDD) analysis technique for detecting catastrophic and parametric faults in analog circuits. Wavelet transform has the property of resolving events in both time and frequency domain simultaneously unlike Fourier transform which decomposes a signal in frequency components only. Simulation results on benchmark circuits show that wavelet transform has higher fault detection sensitivity than Fourier or timedomain methods and hence, can be considered very promising for defect oriented testing of analog circuits. I.
Wavelet Signal Generation for Nonlinear Device Testing Applications
"... Abstract Testing using standard function generators for frequency response, pulse response is common. Oftentimes, certain nonlinear systems such as testing of saturable reactors, semiconductors of the pnpn type as well as testing of avalanche conditions in power transistors need sharp rise and s ..."
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Abstract Testing using standard function generators for frequency response, pulse response is common. Oftentimes, certain nonlinear systems such as testing of saturable reactors, semiconductors of the pnpn type as well as testing of avalanche conditions in power transistors need sharp rise and slow fall signals To this end, a PC based function generator where any kind of signal pattern such as the above, including wavelets could be realized with a very simple circuit, combined with a power OPAMP. Circuits of the above type could be tested using this setup. The software is developed in Visual Basic.
Trim Bit Setting of Analog Filters Using WaveletBased Supply Current Analysis
"... Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently trimanalog filters. The pole/zero locations in the frequency resp ..."
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Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently trimanalog filters. The pole/zero locations in the frequency response of analog filters shift due to change in component values with process variations. Wavelet analysis of supply current can be a promising alternative to test frequency specification of analog filters, since it needs only one test stimulus and is virtually unaffected by transistor threshold variation. Simulation results on two test circuits demonstrate that we can estimate pole/zero shift with less than 3 % error.
Frequency Specification Testing of Analog Filters Using Wavelet Transform of Dynamic Supply Current
"... Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently test the frequency specification of analog filters. The pole/zero ..."
Abstract
 Add to MetaCart
Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that timedomain information obtained from wavelet analysis of supply current can be used to efficiently test the frequency specification of analog filters. The pole/zero locations in the frequency response of analog filters shift due to change in component values with process variations. It is essential to test the filters for the shift in frequency response and fix it, during production test. Wavelet analysis of supply current can be a promising alternative to test frequency specification of analog filters, since it needs only one ac stimulus and is virtually unaffected by transistor threshold variation. Simulation results on two test circuits demonstrate that we can estimate pole/zero shift with less than 3 % error using only one measurement, which requires about 18 measurements in the conventional technique.