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DFT for Digital Detection of Analog Parametric Faults in SC Filters
, 2000
"... Parametric faults are a significant cause of incorrect operation in analog circuits. Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration in which it is use ..."
Abstract

Cited by 4 (0 self)
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Parametric faults are a significant cause of incorrect operation in analog circuits. Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration in which it is used. We present a design for test (DFT) scheme that offers the accuracy needed to test highquality circuits. The DFT scheme is based on a circuit that digitally measures the ratio of a pair of capacitors. The circuit is used to characterize the transfer function of a switched capacitor circuit, which is usually determined by capacitor ratios. In our DFT scheme, capacitor ratios can be measured to within 0.01% accuracy and filter parameters can be shown to be satisfied to within 0.1% accuracy. With this characterization process, a filter can be directly shown to satisfy all specifications that depend on capacitor ratios. We believe the accuracy of our approach is at least an order of magnitude...
Testing of Analog Systems Using Behavioral Models and Optimal Experimental Design Techniques
 Proc. IEEE ICCAD
, 1994
"... This paper describesa new CAD algorithm which performsautomatic test pattern generation (ATPG) for a general class of analog systems, namely those circuits which can be efficiently modeled as an additive combination of userdefined basis functions. The algorithm is based on the statistical technique ..."
Abstract

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This paper describesa new CAD algorithm which performsautomatic test pattern generation (ATPG) for a general class of analog systems, namely those circuits which can be efficiently modeled as an additive combination of userdefined basis functions. The algorithm is based on the statistical technique of Ioptimal experimental design, in which test vectors are chosen to be maximally independent so that circuit performance will be characterized as accurately as possible in the presence of measurement noise and model inaccuracies. This technique allows analog systems to be characterized more accurately and more efficiently, thereby significantly reducing system test time and hence total manufacturing cost. 1 Introduction The complexity of electronic systems being designed today is increasing in many dimensions: on one hand, the number of components is growing constantly; on the other, several radically different functions must be integrated. For example, in the exploding personal communi...