Results 11  20
of
110
Gate Sizing Using Lagrangian Relaxation Combined with a Fast GradientBased PreProcessing Step
 Proc. ICCAD, 2002
"... Abstract ─ In this paper, we present Forge, an optimal algorithm for gate sizing using the Elmore delay model. The algorithm utilizes Lagrangian relaxation with a fast gradientbased preprocessing step that provides an effective set of initial Lagrange multipliers. Compared to the previous Lagrang ..."
Abstract

Cited by 26 (1 self)
 Add to MetaCart
(Show Context)
Abstract ─ In this paper, we present Forge, an optimal algorithm for gate sizing using the Elmore delay model. The algorithm utilizes Lagrangian relaxation with a fast gradientbased preprocessing step that provides an effective set of initial Lagrange multipliers. Compared to the previous Lagrangianbased approach, Forge is considerably faster and does not have the inefficiencies due to difficulttodetermine initial conditions and constant factors. We compared the two algorithms on 30 benchmark designs, on a Sun UltraSparc60 workstation. On average Forge is 200 times faster than the previously published algorithm. We then improved Forge by incorporating a slewratebased convex delay model, which handles distinct rise and fall gate delays. We show that Forge is 15 times faster, on average, than the AMPS transistorsizing tool from Synopsys, while achieving the same delay targets and using similar total transistor area. 1
A New Statistical Optimization Algorithm for Gate Sizing
"... In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nanometer regime. We present a statistical sizing approach that takes into account randomness in gate delays by formulating a ..."
Abstract

Cited by 23 (2 self)
 Add to MetaCart
In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nanometer regime. We present a statistical sizing approach that takes into account randomness in gate delays by formulating a robust linear program that can be solved efficiently. We demonstrate the efficiency and computational tractability of the proposed algorithm on the various ISCAS’85 benchmark circuits. Across the benchmarks, compared to the deterministic approach, the power savings range from 23 − 30 % for the same timing target and the yield level, the average power saving being 28%. The runtime is reasonable, ranging from a few seconds to around 10 mins, and grows linearly.
Transistor Sizing for Minimizing Power Consumption of CMOS Circuits under Delay Constraint
 Proc. of Int'l Symp. on Low Power Design, Monterey CA
, 1995
"... We consider the problem of transistor sizing in a static CMOS layout to minimize the power consumption of the circuit subject to a given delay constraint. Based on our characterization of the short circuit power dissipation of a CMOS circuit we show that the transistors of a gate with high fanout l ..."
Abstract

Cited by 21 (0 self)
 Add to MetaCart
(Show Context)
We consider the problem of transistor sizing in a static CMOS layout to minimize the power consumption of the circuit subject to a given delay constraint. Based on our characterization of the short circuit power dissipation of a CMOS circuit we show that the transistors of a gate with high fanout load should be enlarged to minimize the power consumption of the circuit. We derive analytical formulation for computing the power optimal size of a transistor and isolate the factor a ecting the power optimal size. We extend our model to analyze powerdelay characteristic of a CMOS circuit and derive the powerdelay optimal size of a transistor. Based on our model we develop heuristics to perform transistor sizing in CMOS layouts for minimizing power consumption while meeting given delay constraints. Experimental results (SPICE simulations) are presented to con rm the correctness of our analytical model. 1
A new method for design of robust digital circuits
 Proceedings International Symposium on Quality Electronic Design (ISQED
, 2005
"... As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional circuit optimization methods assuming deterministic gate delays produce a flat “wall ” of equally critical paths, resulting ..."
Abstract

Cited by 17 (1 self)
 Add to MetaCart
(Show Context)
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional circuit optimization methods assuming deterministic gate delays produce a flat “wall ” of equally critical paths, resulting in variationsensitive designs. This paper describes a new method for sizing of digital circuits, with uncertain gate delays, to minimize their performance variation leading to a higher parametric yield. The method is based on adding margins on each gate delay to account for variations and using a new “soft maximum ” function to combine path delays at converging nodes. PSfrag Using replacements analytic models to predict the means and standard deterministic deviations method of gate delays as posynomial functions of the device sizes, PDF we create a simple, computationally efficient heuristic for uncertaintyaware sizing of digital circuits via Geometric Programming. MonteCarlo simulations on custom 32bit adders and ISCAS’85 benchmarks show that about 10 % to 20 % delay reduction over deterministic sizing methods can be achieved, without any additional cost in area. 1.
An Efficient Approach To Simultaneous Transistor And Interconnect Sizing
 IN PROC. INT. CONF. ON COMPUTER AIDED DESIGN
, 1996
"... In this paper, we study the simultaneous transistor and interconnect sizing (STIS) problem. We define a class of optimization problems as CHposynomial programs and reveal a general dominance property for all CHposynomial programs (Theorem 1). We show that the STIS problems under a number of transi ..."
Abstract

Cited by 16 (8 self)
 Add to MetaCart
In this paper, we study the simultaneous transistor and interconnect sizing (STIS) problem. We define a class of optimization problems as CHposynomial programs and reveal a general dominance property for all CHposynomial programs (Theorem 1). We show that the STIS problems under a number of transistor delay models are CHposynomial programs and propose an efficient and nearoptimal STIS algorithm based on the dominance property. When used to solve the simultaneous driver/buffer and wire sizing problem for real designs, it reduces the maximum delay by up to 17.7%, and more significantly, reduces the power consumption by a factor of 61.6%, when compared with the original designs. When used to solve the transistor sizing problem, it achieves a smooth areadelay tradeoff. Moreover, the algorithm optimizes a clock net of 367 drivers/buffers and 59304mlong wire in 120 seconds, and a 32bit adder with 1,026 transistors in 66 seconds on a SPARC5 workstation.
Interleaving buffer insertion and transistor sizing into a single optimization
 IEEE Transactions on VLSI
, 1998
"... Buffer insertion is a technique that is used either to increase the driving power of a path in a circuit, or to isolate large capacitive loads that lie on noncritical or less critical paths. Gate sizing sets the sizes of gates within a circuit to achieve a given timing specification. Traditional des ..."
Abstract

Cited by 16 (0 self)
 Add to MetaCart
Buffer insertion is a technique that is used either to increase the driving power of a path in a circuit, or to isolate large capacitive loads that lie on noncritical or less critical paths. Gate sizing sets the sizes of gates within a circuit to achieve a given timing specification. Traditional design techniques perform gate sizing and buffer insertion as two separate and independent steps during synthesis. However, until sizing is performed, any information on capacitive loads is incomplete and therefore a buffer insertion algorithm must operate with incomplete information, leading to suboptimal results. Moreover, the insertion of buffers can change the structure of the circuit sufficiently so that it may lead to a different sizing solution from the unbuffered circuit. Therefore, these techniques of buffer insertion and sizing are intimately linked and it makes a lot of sense to integrate them into a single optimization. This work presents strategies to insert buffers in a circuit, combined with gate sizing, to achieve better powerdelay and areadelay tradeoffs. The purpose of this work is to examine how combining sizing algorithm with buffer insertion will help us achieve better areadelay or powerdelay tradeoffs, and to determine where and when to insert buffers in a circuit. The delay model incorporates placementbased information and the effect of input slew rates on gate delays. The results obtained by using the new method are significantly better than the results
Variability Driven Gate Sizing for Binning Yield Optimization
 IN PROCEEDINGS OF ACM/IEEE DESIGN AUTOMATION CONFERENCE
, 2006
"... Process variations result in a considerable spread in the frequency of the fabricated chips. In high performance applications, those chips that fail to meet the nominal frequency after fabrication are either discarded or sold at a loss which is typically proportional to the degree of timing violatio ..."
Abstract

Cited by 15 (0 self)
 Add to MetaCart
Process variations result in a considerable spread in the frequency of the fabricated chips. In high performance applications, those chips that fail to meet the nominal frequency after fabrication are either discarded or sold at a loss which is typically proportional to the degree of timing violation. The latter is called binning. In this paper we present a gate sizingbased algorithm that optimally minimizes the binning yieldloss. We make the following contributions: 1) prove the binning yield function to be convex, 2) do not make any assumptions about the sources of variability, and their distribution model, 3) we integrate our strategy with statistical timing analysis tools (STA), without making any assumptions about how STA is done, 4) if the objective is to optimize the traditional yield (and not binning yield) our approach can still optimize the same to a very large extent. Comparison of our approach with sensitivitybased approaches under fabrication variability shows an improvement of on average 72 % in the binning yieldloss with an area overhead of an average 6%, while achieving a 2.69 times speedup under a stringent timing constraint. Moreover we show that a worstcase deterministic approach fails to generate a solution for certain delay constraints. We also show that optimizing the binning yieldloss minimizes the traditional yieldloss with a 61 % improvement from a sensitivitybased approach.
Optimizing dominant time constant in RC circuits
, 1996
"... We propose to use the dominant time constant of a resistorcapacitor (RC) circuit as a measure of the signal propagation delay through the circuit. We show that the dominant time constant is a quasiconvex function of the conductances and capacitances, and use this property to cast several interestin ..."
Abstract

Cited by 15 (7 self)
 Add to MetaCart
We propose to use the dominant time constant of a resistorcapacitor (RC) circuit as a measure of the signal propagation delay through the circuit. We show that the dominant time constant is a quasiconvex function of the conductances and capacitances, and use this property to cast several interesting design problems as convex optimization problems, specifically, semidefinite programs (SDPs). For example, assuming that the conductances and capacitances are affine functions of the design parameters (which is a common model in transistor or interconnect wire sizing), one can minimize the power consumption or the area subject to an upper bound on the dominant time constant, or compute the optimal tradeoff surface between power, dominant time constant, and area. We will also note that, to a certain extent, convex optimization can be used to design the topology of the interconnect wires. This approach has two advantages over methods based on Elmore delay optimization. First, it handles a far wider class of circuits, e.g., those with nongrounded capacitors. Second, it always results in convex optimization problems for which very efficient interiorpoint methods have recently been developed. We illustrate the method, and extensions, with several examples involving optimal wire and transistor sizing.
Simultaneous Gate and Interconnect Sizing for CircuitLevel Delay Optimization
 Proceedings of the 32nd Design Automation Conference
, 1995
"... Abstract—With delays due to the physical interconnect dominating the overall logic path delays, circuitlevel delay optimization must take interconnect effects into account. Instead of sizing only the gates along the critical paths for delay reduction, the tradeoff possible by simultaneously sizi ..."
Abstract

Cited by 15 (1 self)
 Add to MetaCart
(Show Context)
Abstract—With delays due to the physical interconnect dominating the overall logic path delays, circuitlevel delay optimization must take interconnect effects into account. Instead of sizing only the gates along the critical paths for delay reduction, the tradeoff possible by simultaneously sizing gate and interconnect must also be considered. We show that for optimal gate and interconnect sizing, it is imperative that the interaction between the driver and the RC interconnect load be taken into account. We present an iterative sensitivitybased approach to simultaneous gate and interconnect sizing in terms of a gate delay model which captures this interaction. During each iteration, the path delay sensitivities are efficiently calculated and used to size the components along a path. I.
Power modeling and architecture evaluation for FPGA with novel circuits for vdd programmability
 in Proc. ACM Intl. Symp. FieldProgrammable Gate Arrays, Februray
, 2005
"... Vddprogrammable FPGAs have been proposed recently to reduce FPGA power, where Vdd levels can be customized for different circuit elements and unused circuit elements can be powergated. In this paper, we first develop an accurateFPGApowermodelandthendesignnovelVddprogrammable interconnect switches ..."
Abstract

Cited by 14 (9 self)
 Add to MetaCart
(Show Context)
Vddprogrammable FPGAs have been proposed recently to reduce FPGA power, where Vdd levels can be customized for different circuit elements and unused circuit elements can be powergated. In this paper, we first develop an accurateFPGApowermodelandthendesignnovelVddprogrammable interconnect switches with minimum number of configuration SRAM cells. Applying our power model to placed and routed benchmark circuits, we evaluate Vddprogrammable FPGA architecture using the new switches. The best architecture in our study uses Vddprogrammable logic blocks and Vddgateable interconnects. Compared to the baseline architecture similar to the leading commercial architecture, the best architecture reduces the minimal energydelay product by 44.14 % with 48 % area overhead and 3 % SRAM cell increase. Our evaluation results also show that LUT size 4 always gives the lowest energy consumption while LUT size 7 always leads to the highest performance for all evaluated architectures.