In this paper we present a new model for diagnosis of errors in Synchronous Sequential Circuits (SCC) on the functional level. In contrast to many previously published approaches we do not consider a specific implementation. Instead we use tests based on the transition behavior of the corresponding Finite State Machine (FSM). Thus, the approach can be used for verification and test. We describe a method for constructing a minimal cost test based on AND/OR graphs. Exact and heuristic methods are presented. First experimental results for randomly generated FSMs are given that demonstrate the efficiency of our approach. 1 Introduction Nowadays, circuit design is becoming more and more complex. Thus, the error probability also increases. Since time-to-market aspects are increasingly important it is desirable to detect errors as early as possible. Additionally, this also reduces the production costs. For this, nowadays CAD tools should also support features for error diagnosis, i.e. error...

A general framework of the Sequential Diagnosis Tool that is currently under development in the Computer Systems Department at the Jo#ef Stefan Institute is presented in this paper. The tool can be used as an experimental environment for the analysis of solutions of the test sequencing problem. For example, changes of decision trees and their costs as a function of system failure data can be studied. The tool also represents the basis of system diagnosis software package for a system maintenance and repair. V #lanku je opisan splo#ni koncept orodja za sekven#no diagnosticiranje, ki ga razvijamo v Odseku za ra#unalni#ke sisteme na Institutu Jo#ef Stefan. Orodje lahko slu#i kot eksperimentalno okolje za analiziranje re#itev problema generiranja testnih sekvenc. Tako lahko na primer prou#ujemo spremembe odlo #itvenih dreves in njihovih cen v odvisnosti od podatkov o odpovedi sistema. Obenem je opisano orodje osnova programskega okolja za sekven#no diagnosticiranje v okviru sistemskega vzd...

In this paper we propose an approach to a general test presentation that covers the situations with multiple test outcomes, noiseless tests and unreliable (noisy) tests as the input data for the solutions of the test sequencing problem. Symptomatic information and modular diagnosis are also easily included within the same frame.