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Mismatch Analysis and Direct Yield Optimization by SpecWise Linearization and FeasibilityGuided Search
 IEEE DAC
, 2001
"... We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency of yield estimation and optimization are guaranteed by consideration of feasibility regions and by perfo ..."
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Cited by 24 (2 self)
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We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency of yield estimation and optimization are guaranteed by consideration of feasibility regions and by performance linearization at worstcase points. The proposed methods were successfully applied to two example circuits for an industrial fabrication process.
The Generalized Boundary Curve  A Common Method for Automatic Nominal Design and Design Centering of Analog Circuits
 IN PROCEEDINGS DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 2000
, 2000
"... In this paper, a new method for analog circuit sizing with respect to manufacturing and operating tolerances is presented. Two types of robustness objectives are presented, i.e. parameter distances for the nominal design and worstcase distances for the design centering. Moreover, the generalized bou ..."
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Cited by 4 (1 self)
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In this paper, a new method for analog circuit sizing with respect to manufacturing and operating tolerances is presented. Two types of robustness objectives are presented, i.e. parameter distances for the nominal design and worstcase distances for the design centering. Moreover, the generalized boundary curve is presented as a method to determine a parameter correction within an iterative trust region algorithm. Results show that a significant reduction in computational costs is achieved using the presented robustness objectives and generalized boundary curve.
A Parametric Test Method for Analog Components
 in Integrated Mixedsignal Circuits”, IEEE/ACM International Conference on Computer Aided Design
, 2000
"... In this paper, we present a novel approach to use test stimuli generated by digital components of a mixedsignal circuit for testing its analog components. A wavelet transform is applied to the response signal of the device under test (DUT). We will show, that in comparison to Fourier transform or ..."
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Cited by 2 (0 self)
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In this paper, we present a novel approach to use test stimuli generated by digital components of a mixedsignal circuit for testing its analog components. A wavelet transform is applied to the response signal of the device under test (DUT). We will show, that in comparison to Fourier transform or no transform at all, particular properties of this transformation are advantageous for mixedsignal test and especially builtin self test. We introduce a new method for test measurement selection based on a nondeterministic parametric fault model for analog circuits. This approach allows for noise and measurement error in testing. We show, how test quality can be optimized in the presented fault model. Our test methodology is demonstrated on an analog CMOS bandpass filter. 1
ON METHODS FOR ORDERING SPARSE MATRICES IN CIRCUIT SIMULATION
"... Recently proposed methods for ordering sparse symmetric matrices are discussed and their performance is compared with that of the Minimum Degree and the Minimum Local Fill algorithms. It is shown that these methods applied to symmetrized modified nodal analysis matrices yield orderings significantly ..."
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Cited by 1 (1 self)
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Recently proposed methods for ordering sparse symmetric matrices are discussed and their performance is compared with that of the Minimum Degree and the Minimum Local Fill algorithms. It is shown that these methods applied to symmetrized modified nodal analysis matrices yield orderings significantly better than those obtained from the Minimum Degree and Minimum Local Fill algorithms, in some cases at virtually no extra computational cost. 1.
Network Approach and DifferentialAlgebraic Systems in Technical Applications
 Surv. Math. Ind
, 1999
"... this paper we concentrate on the second step, especially the network approach for the automatic generation of the mathematical model. We achieve a descriptor formulation which is characterized by a differentialalgebraic system (DAE). Their numerical solution creates new difficulties, which are cha ..."
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Cited by 1 (0 self)
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this paper we concentrate on the second step, especially the network approach for the automatic generation of the mathematical model. We achieve a descriptor formulation which is characterized by a differentialalgebraic system (DAE). Their numerical solution creates new difficulties, which are characterized by the index concept.
Analog Circuit Sizing using Adaptive WorstCase Parameter Sets
, 2002
"... In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worstcase parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs w ..."
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Cited by 1 (0 self)
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In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worstcase parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods.
A NEW METHOD FOR ORDERING SPARSE MATRICES AND ITS PERFORMANCE IN CIRCUIT SIMULATION
"... Local algorithms for obtaining a pivot ordering for sparse symmetric coefficient matrices are reviewed together with their mathematical background and appropriate data structures. Recently proposed heuristics as well as improvements to them are discussed, and their performance, mainly in terms of th ..."
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Local algorithms for obtaining a pivot ordering for sparse symmetric coefficient matrices are reviewed together with their mathematical background and appropriate data structures. Recently proposed heuristics as well as improvements to them are discussed, and their performance, mainly in terms of the resulting number of factorization operations, is compared with that of the Minimum Degree and the Minimum Local Fill algorithms. It is demonstrated that a combination of Markowitz ’ algorithm with these symmetric methods applied to the unsymmetric matrices arising in circuit simulation is capable of accelerating the simulation significantly. 1.
unknown title
, 2001
"... 1On the performance of minimum degree and minimum local fill heuristics in circuit simulation Gunther Reiig Before you cite this report, please check whether it has already appeared as a ..."
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1On the performance of minimum degree and minimum local fill heuristics in circuit simulation Gunther Reiig Before you cite this report, please check whether it has already appeared as a