A Simulation Experiment on a Built–In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi–Input Shift Register (MISR (0)

by Afaq Ahmad
Venue:International Journal of VLSI design & Communication Systems (VLSICS), December 2010, Volume 1, Number 4, ISSN : 0976 – 1357 (Online : http://airccse.org/journal/vlsi/currissue.html) ; 0976 – 1527 (print