Application of RHBD techniques to SEU hardening of third-generation SiGe HBT logic circuits (2006)

by R Krithivasan, P W Marshall, M Nayeem, A K Sutton, W-M Kuo, B M Haugerud, L Najafizadeh, J D Cressler, M A Carts, C J Marshall, D L Hansen, K-C M Jobe, A L McKay, G Niu, R Reed, B A Randall, C A Burfield, B K Gilbert Lindberg, E S Daniel
Venue:IEEE Trans. Nuclear Science