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An affine scaling methodology for best basis selection
 IEEE Trans. Signal Processing
, 1999
"... Abstract — A methodology is developed to derive algorithms for optimal basis selection by minimizing diversity measures proposed by Wickerhauser and Donoho. These measures include the pnormlike (`(p 1)) diversity measures and the Gaussian and Shannon entropies. The algorithm development methodolog ..."
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Cited by 79 (11 self)
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Abstract — A methodology is developed to derive algorithms for optimal basis selection by minimizing diversity measures proposed by Wickerhauser and Donoho. These measures include the pnormlike (`(p 1)) diversity measures and the Gaussian and Shannon entropies. The algorithm development methodology uses a factored representation for the gradient and involves successive relaxation of the Lagrangian necessary condition. This yields algorithms that are intimately related to the Affine Scaling Transformation (AST) based methods commonly employed by the interior point approach to nonlinear optimization. The algorithms minimizing the `(p 1) diversity measures are equivalent to a recently developed class of algorithms called FOCal Underdetermined System Solver (FOCUSS). The general nature of the methodology provides a systematic approach for deriving this class of algorithms and a natural mechanism for extending them. It also facilitates a better understanding of the convergence behavior and a strengthening of the convergence results. The Gaussian entropy minimization algorithm is shown to be equivalent to a wellbehaved p =0normlike optimization algorithm. Computer experiments demonstrate that the pnormlike and the Gaussian entropy algorithms perform well, converging to sparse solutions. The Shannon entropy algorithm produces solutions that are concentrated but are shown to not converge to a fully sparse solution. I.
Comparison of Basis Selection Methods
, 1996
"... In this paper, we describe and evaluate three forward sequential basis selection methods: Basic Matching Pursuit (BMP), Order Recursive Matching Pursuit (ORMP) and Modified Matching Pursuit (MMP), and a parallel basis selection method: the FOCal Underdetermined System Solver (FOCUSS) algorithm. Com ..."
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Cited by 16 (3 self)
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In this paper, we describe and evaluate three forward sequential basis selection methods: Basic Matching Pursuit (BMP), Order Recursive Matching Pursuit (ORMP) and Modified Matching Pursuit (MMP), and a parallel basis selection method: the FOCal Underdetermined System Solver (FOCUSS) algorithm. Computer simulations show that the ORMP method is superior to the BMP method in terms of its ability to select a compact basis set. However, it is computationally more complex. The MMP algorithm is developed which is of intermediate computational complexity and has performance comparable to the ORMP method. All the sequential selection methods are shown to have difficulty in environments where the basis set contains highly correlated vectors. The drawback can be traced to the sequential nature of these methods suggesting the need for a parallel basis selection method like FOCUSS. Simulations demonstrate that the FOCUSS algorithm does indeed perform well in such correlated environments. However,...
Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits
, 1995
"... Abstract A comprehensive tool has been implemented for the comparison of different test preparation techniques and target faults. It comprises of the realistic fault characterisation program LIFT that can extract sets of various faults from a given analogue or mixedsignal circuit layout and the au ..."
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Cited by 6 (0 self)
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Abstract A comprehensive tool has been implemented for the comparison of different test preparation techniques and target faults. It comprises of the realistic fault characterisation program LIFT that can extract sets of various faults from a given analogue or mixedsignal circuit layout and the automatic analogue fault simulation program AnaFAULT which can handle arbitrary catastrophic and parametric faults. For a fabricated integrated VCO circuit the capabilities of the tool are demonstrated and simulation results are presented. assumption of the complete set of possible faults taken from the schematic. After the introduction and the stateoftheart, the application procedure of the universal CAT tool within the
ModelBased Analogue Circuit Diagnosis with CLP(R)
"... Modelbased diagnosis is the activity of locating malfunctioning components of a system solely on the basis of its structure and behavior. Diagnostic systems usually rely on qualitative models and reason by local constraint propagation methods. However, there is a large class of applications where A ..."
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Cited by 5 (5 self)
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Modelbased diagnosis is the activity of locating malfunctioning components of a system solely on the basis of its structure and behavior. Diagnostic systems usually rely on qualitative models and reason by local constraint propagation methods. However, there is a large class of applications where ATMSlike systems or pure logic programs are unpractical since they are unable to solve simultaneous equations. In particular, modeling realvalued system parameters with tolerances requires some degree of numerical processing, and feedback loops in general cannot be resolved by Appears in Proc. 4th Intl. GI Congress (W. Brauer, D. Hernandez, Eds.), pp. 343353, Munchen, October 2324, 1991, SpringerVerlag (IFB 291). local constraint propagation methods. Examples of such systems are analogue circuits, e.g., amplifiers or filters. In the paper we describe the role of Constraint Logic Programs over the domain of reals (CLP(!)) in representing both, qualitative and numerical models. CLP(!)...
Low cost test of embedded RF/analog/mixedsignal circuits in SOPs
 IEEE Trans. on Advanced Packaging
, 2004
"... Abstract: Increasing levels of integration and high speeds of operation have made the problem of testing complex systemsonpackages very difficult. Testing packages with multigigahertz RF and optical components is even more difficult as external tester costs tend to escalate rapidly beyond 3 GHz. ..."
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Cited by 2 (0 self)
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Abstract: Increasing levels of integration and high speeds of operation have made the problem of testing complex systemsonpackages very difficult. Testing packages with multigigahertz RF and optical components is even more difficult as external tester costs tend to escalate rapidly beyond 3 GHz. The extent of the problem can be gauged by the fact that test cost is approaching almost 40 % of the total manufacturing cost of these packages. To alleviate test costs, various solutions relying on builtoff test (BOT) and builtin test (BIT) of embedded highspeed components of SOPs have been developed. These migrate some of the external tester functions to the tester load board (BOT) and to the package and the die encapsulated in the package (BIT) in an “intelligent ” manner. This paper provides a discussion of the emerging BOT and BIT schemes for embedded highspeed RF/analog/mixedsignal circuits in SOPs. The pros and cons of each scheme are discussed and preliminary available data on case studies are presented. Index Terms: SOP testing, analog system testing, builtin testing, digital system testing, automatic test equipment, design for testability, manufacturing testing, selftesting, builtoff testing.
On Ycompatible and strict Ycompatible functions
, 1997
"... Let Y 2 IR n . A function f : IR n ! IR k Y compatible, if for any Z 2 IR n , Z Y if and only if f(Z) f(Y ) and is strict Y compatible, if for any Z 2 IR n , Z ! Y if and only if f(Z) ! f(Y ). It is proved that for any Y 2 IR n , n 2, there is no Y compatible polynomial function f ..."
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Cited by 1 (1 self)
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Let Y 2 IR n . A function f : IR n ! IR k Y compatible, if for any Z 2 IR n , Z Y if and only if f(Z) f(Y ) and is strict Y compatible, if for any Z 2 IR n , Z ! Y if and only if f(Z) ! f(Y ). It is proved that for any Y 2 IR n , n 2, there is no Y compatible polynomial function f : IR n ! IR k , 1 k ! n. It is also proved that for a strict Y compatible map f , J f (Y ) = 0, where J f (Y ) denote the Jacobian matrix of the mapping f in Y . These problems arose in studying data compression of analog signatures. 1 Introduction This work was initiated by the problems of storage and processing of measured response data of analog circuits normally used by the fault dictionary techniques in fault localization [1], [2]. We explore the possibility of data compression of a series of real numbers representing given response data. In particular, we are looking for some data compression function that would enable us to determine for any two given responses y 1 , y 2 , : ...
Fault Emulation: Reconfigurable HardwareBased Fault Simulation Using Logic Emulation Systems with Optimized Mapping
, 1999
"... ..."
TABLE OF CONTENTS
"... I wish to express my sincere gratitude to Dr. Janusz Starzyk, for his advice, guidance t invaluable comments and suggestions in prepearing this thesis. I am also thankful to Dr. Roger Radcliff for ..."
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I wish to express my sincere gratitude to Dr. Janusz Starzyk, for his advice, guidance t invaluable comments and suggestions in prepearing this thesis. I am also thankful to Dr. Roger Radcliff for