• Documents
  • Authors
  • Tables
  • Log in
  • Sign up
  • MetaCart
  • DMCA
  • Donate

CiteSeerX logo

Advanced Search Include Citations

Tools

Sorted by:
Try your query at:
Semantic Scholar Scholar Academic
Google Bing DBLP
Results 1 - 10 of 9,185
Next 10 →

Low-Power CMOS Digital Design

by Anantha P. Chandrakasan, Samuel Sheng, Robert W. Brodersen - JOURNAL OF SOLID-STATE CIRCUITS. VOL 27, NO 4. APRIL 1992 413 , 1992
"... Motivated by emerging battery-operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput. Techniques for low-power operation are shown which use the ..."
Abstract - Cited by 580 (20 self) - Add to MetaCart
Motivated by emerging battery-operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput. Techniques for low-power operation are shown which use

Subthreshold Voltage High-k CMOS Devices Have Lowest Energy and High Process Tolerance

by Muralidharan Venkatasubramanian, Vishwani D. Agrawal
"... Abstract — Evolving nanometer CMOS technologies provide low power, high performance and higher levels of integration but suffer from increased subthreshold leakage and excessive process variation. The present work examines the 45nm bulk and high-k technologies. We evaluate the performance of a 32-bi ..."
Abstract - Cited by 1 (0 self) - Add to MetaCart
Abstract — Evolving nanometer CMOS technologies provide low power, high performance and higher levels of integration but suffer from increased subthreshold leakage and excessive process variation. The present work examines the 45nm bulk and high-k technologies. We evaluate the performance of a 32

Data networks

by L. Verger G, E. Gros D'aillon G, P. Major H, G. Németh H , 1992
"... a b s t r a c t In this paper we illustrate the core technologies at the basis of the European SPADnet project (www. spadnet.eu), and present the corresponding first results. SPADnet is aimed at a new generation of MRI-compatible, scalable large area image sensors, based on CMOS technology, that are ..."
Abstract - Cited by 2210 (5 self) - Add to MetaCart
a b s t r a c t In this paper we illustrate the core technologies at the basis of the European SPADnet project (www. spadnet.eu), and present the corresponding first results. SPADnet is aimed at a new generation of MRI-compatible, scalable large area image sensors, based on CMOS technology

System architecture directions for networked sensors

by Jason Hill, Robert Szewczyk, Alec Woo, Seth Hollar, David Culler, Kristofer Pister - IN ARCHITECTURAL SUPPORT FOR PROGRAMMING LANGUAGES AND OPERATING SYSTEMS , 2000
"... Technological progress in integrated, low-power, CMOS communication devices and sensors makes a rich design space of networked sensors viable. They can be deeply embedded in the physical world or spread throughout our environment. The missing elements are an overall system architecture and a methodo ..."
Abstract - Cited by 1789 (58 self) - Add to MetaCart
Technological progress in integrated, low-power, CMOS communication devices and sensors makes a rich design space of networked sensors viable. They can be deeply embedded in the physical world or spread throughout our environment. The missing elements are an overall system architecture and a

Modeling the effect of technology trends on the soft error rate of combinational logic

by Premkishore Shivakumar, Michael Kistler, Stephen W. Keckler, Doug Burger, Lorenzo Alvisi, Ibm Technical, Contacts John Keaty, Rob Bell, Ram Rajamony , 2002
"... This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to-end model that enables us to compute the soft error rates (SER) for existing and future microprocessor-style designs. Th ..."
Abstract - Cited by 374 (8 self) - Add to MetaCart
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to-end model that enables us to compute the soft error rates (SER) for existing and future microprocessor-style designs

Gate dielectric scaling for high-performance CMOS: from SiO2 to High-K

by Robert Chau, Suman Datta, Mark Doczy, Jack Kavalieros, Matthew Metz - In IWGI, 2003. 84 , 2004
"... We have successfully demonstrated very high-performance PMOS and NMOS transistors with high-K/metal-gate gate stacks with the right threshold voltages for both p- and n-channels on bulk Si. We believe that high-K/metal-gate is an option for the 45nm high-performance logic technology node. 1. ..."
Abstract - Cited by 12 (0 self) - Add to MetaCart
We have successfully demonstrated very high-performance PMOS and NMOS transistors with high-K/metal-gate gate stacks with the right threshold voltages for both p- and n-channels on bulk Si. We believe that high-K/metal-gate is an option for the 45nm high-performance logic technology node. 1.

Single-pixel imaging via compressive sampling

by Marco F. Duarte, Mark A. Davenport, Dharmpal Takhar, Jason N. Laska, Ting Sun, Kevin F. Kelly, Richard G. Baraniuk - IEEE Signal Processing Magazine
"... Humans are visual animals, and imaging sensors that extend our reach – cameras – have improved dramatically in recent times thanks to the introduction of CCD and CMOS digital technology. Consumer digital cameras in the mega-pixel range are now ubiquitous thanks to the happy coincidence that the semi ..."
Abstract - Cited by 296 (19 self) - Add to MetaCart
Humans are visual animals, and imaging sensors that extend our reach – cameras – have improved dramatically in recent times thanks to the introduction of CCD and CMOS digital technology. Consumer digital cameras in the mega-pixel range are now ubiquitous thanks to the happy coincidence

CMOS Development and Optimization, Scaling Issue and Replacement with High-k Material for Future Microelectronics

by Davinder Rathee, Mukesh Kumar, Sandeep K. Arya
"... been guided by CMOS scaling theory [1] and predications made by Semiconductor Industry (SIA) in the International Technology Roadmap for Semiconductor (ITRS). With the trend of scaling down of Complementary Metal Oxide Semiconductor (CMOS) transistor as Moore’s Law [2] requires replacement of conven ..."
Abstract - Add to MetaCart
principle of physics. Here we have elaborated about scaling issues and alternate high-k dielectric for Metal Oxide Semiconductor Field Effect Transistor (MOSFET). Introducing a high-k material may replace today’s silicon dioxide technology and can also provide extendibility over several generations. C

Low Power CMOS Digital Design

by Anantha P. Chandrakasan, Samuel Sheng, Robert W. Brodersen - IEEE JOURNAL OF SOLID STATE CIRCUITS , 1995
"... Motivated by emerging battery operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput. Techniques for low power operation are shown which use the ..."
Abstract - Cited by 146 (0 self) - Add to MetaCart
Motivated by emerging battery operated applications that demand intensive computation in portable environments, techniques are investigated which reduce power consumption in CMOS digital circuits while maintaining computational throughput. Techniques for low power operation are shown which use

Bus-invert coding for low-power I/O

by Mircea R. Stan, Wayne P. Burleson - IEEE TRANS. VLSI SYST , 1995
"... Technology trends and especially portable applications drive the quest for low-power VLSI design. Solutions that involve algorithmic, structural or physical transformations are sought. The focus is on developing low-power circuits without affecting too much the performance (area, latency, period). ..."
Abstract - Cited by 222 (5 self) - Add to MetaCart
Technology trends and especially portable applications drive the quest for low-power VLSI design. Solutions that involve algorithmic, structural or physical transformations are sought. The focus is on developing low-power circuits without affecting too much the performance (area, latency, period
Next 10 →
Results 1 - 10 of 9,185
Powered by: Apache Solr
  • About CiteSeerX
  • Submit and Index Documents
  • Privacy Policy
  • Help
  • Data
  • Source
  • Contact Us

Developed at and hosted by The College of Information Sciences and Technology

© 2007-2019 The Pennsylvania State University