Searching for authors named Sandip Kundu – sorted by Relevance.
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An improved technique for reducing false alarms due to soft errors
- if the implementation of exclusion technique is not perfect. 1. Introduction Sandip Kundu Department of ECE University
- Cited by 1 (1 self) – Add To MetaCart
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Inductance Analysis of On-Chip Interconnects
- -chip driver (receiver) resistance is Sandip Kundu and Uttam Ghoshal IBM Austin Research Laboratory Austin, TX
- Cited by 4 (0 self) – Add To MetaCart
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Circuit and Platform Design Challenges in Technologies beyond 90nm
- on a recurring and 1530-1591/03 $17.00 © 2003 IEEE Bill Grundmann, Rajesh Galivanche, Sandip Kundu
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Defect-Based Test: A Key Enabler for Successful Migration to Structural Test
- to Structural Test Sanjay Sengupta, MPG Test Technology, Intel Corp. Sandip Kundu, MPG Test Technology, Intel
- Cited by 9 (0 self) – Add To MetaCart
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Incremental synthesis
- Incremental Synthesis Daniel Brand Anthony Drumm Sandip Kundu Prakash Narain IBM Research Division
- Cited by 12 (1 self) – Add To MetaCart
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On Output Response Compression in the Presence of Unknown Output Values
- of ECE, Purdue University, W. Lafayette, IN 47907, pomeranz@(email omitted); Sandip Kundu, Intel Corp
- Cited by 4 (1 self) – Add To MetaCart
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On the Characterization of Hard-to-Detect Bridging Faults
- Sandip Kundu, Intel Corp., Austin, TX 78746 Abstract We investigate a characterization of hard
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Performance Sensitivity Analysis Using Statistical Methods and Its Applications to Delay Testing
- Jing-Jia Liou Angela Krstić Kwang-Ting Cheng Deb Aditya Mukherjee Sandip Kundu ECE Department, Intel
- Cited by 14 (10 self) – Add To MetaCart

