Searching for authors named Dong Sam Ha – sorted by Relevance.
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A Low-Power Variable Resolution Analog-To-Digital Converter
- algorithm and its advantages for our 460 Dong Sam Ha Virginia Tech VLSI for Telecommunications (VTVT) Lab
- Cited by 1 (0 self) – Add To MetaCart
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A Low-Power Viterbi Decoder Design for Wireless Communications Applications
- obtained by backtracing in time corresponds to the decoded output. 1 Dong Sam Ha Bradley Dept
- Cited by 1 (0 self) – Add To MetaCart
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On the Low-Power Design of DCT and IDCT for Low Bit-Rate Video Codecs
- , consuming 21% of the 203 Dong Sam Ha Virginia Tech VLSI for Telecommunications (VTVT) Lab Bradley Dept
- Cited by 2 (0 self) – Add To MetaCart
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A new approach for massive parallel scan design
- A NEW APPROACH FOR MASSIVE PARALLEL SCAN DESIGN Woo Cheol Chung and Dong Sam Ha VTVT (Virginia
- Cited by 2 (1 self) – Add To MetaCart
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An Efficient Method For Compressing Test Data
- , Masahiro Ishida 1 , and Dong Sam Ha 3 1 Advantest Laboratories Ltd. 48-2 Matsubara, Kamiayashi, Aoba
- Cited by 17 (0 self) – Add To MetaCart
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On ILP Formulations for Built-In Self-Testable Data Path Synthesis
- allocates signature registers first, so Proc. 36 th DAC, June 1999, New Orleans, USA Dong Sam Ha Dept
- Cited by 1 (1 self) – Add To MetaCart
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Performance Improvement of Geographically Distributed Cosimulation by Hierarchically Grouped Messages
- Yoo, Kiyoung Choi, and Dong Sam Ha, Senior Member, IEEE Abstract—To improve the performance
- Cited by 1 (1 self) – Add To MetaCart
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A High-Level BIST Synthesis Method Based on a Region-wise Heuristic for an Integer Linear Programming
- Programming Han Bin Kim and Dong Sam Ha Bradley Dept. of Electrical and Computer Engineering Virginia
- Cited by 4 (2 self) – Add To MetaCart
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Test Session Oriented Built-in Self-testable Data Path Synthesis
- incorporated, high-level test synthesis systems can be Han Bin Kim 1 , Takeshi Takahashi 2 , and Dong Sam Ha 1
- Cited by 5 (3 self) – Add To MetaCart
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I_DDT Testing: An Efficient Method for Detecting Delay Faults and Open Defects
- : An Efficient Method for Detecting Delay Faults and Open Defects * Masahiro Ishida 1 , Dong Sam Ha 2 , Takahiro
- Cited by 2 (0 self) – Add To MetaCart

