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Searching for authors named "Yiorgos Makris" – sorted by Relevance.

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Help! 6 documents found, showing 1 through 6.
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  • Concurrent Fault Detection in Random Combinational Logic  
  • by Petros Drineas, Yiorgos Makris — 1985 — in Proceedings of the IEEE International Symposium on Quality Electronic Design (ISQED
  • …We discuss a non-intrusive methodology for concurrent fault detection in random combinational logic. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor that immediately detects potential faults by comparison to the original circuit. However, instead o…
  • Cited by 2 (0 self)Add To MetaCart
  • Channel-Based Behavioral Test Synthesis for Improved Module Reachability  
  • by Yiorgos Makris And, Yiorgos Makris, Alex P. Hvy'lu — 1999
  • …We introduce a novel behavioral test synthesis methodology that attempts to increase module reachability, driven by powerful global design path analysis. Based on the notion of transparency channels, test justification and propagation bottlenecks are revealed for each module in the design. Subsequen…
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  • RTL Test Justification and Propagation Analysis for Modular Designs  
  • by Yiorgos Makris And, Yiorgos Makris, Alex, Orailo Glu, N. Jha — 1998 — Journal of Electronic Testing: Theory and Applications (JETTA
  • …. Modular decomposition and functional abstraction are commonly employed to accommodate the growing size and complexity of modern designs. In the test domain, a divide & conquer type of approach is utilized, wherein test is locally generated at each module's boundary and consequently translated to g…
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  • A Module Diagnosis and Design-for-Debug Methodology Based on Hierarchical Test Paths  
  • by Yiorgos Makris, Alex Orailoglu, Lrujrv Dnulv $oh Udlor÷lu
  • …Fault identification capabilities are becoming increasingly important in modern designs, not only in support of design debugging methodologies, but also for the purpose of process characterization and yield enhancement. At the same time, hierarchical test approaches are becoming the prevalent means …
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  • RTL Test Justification and Propagation Analysis for Modular Designs  
  • by Yiorgos Makris, Alex Orailoglu, Alex Orailo ˘glu, N. Jha — 1999 — Journal of Electronic Testing: Theory and Applications (JETTA
  • …. Modular decomposition and functional abstraction are commonly employed to accommodate the growing size and complexity of modern designs. In the test domain, a divide & conquer type of approach is utilized, wherein test is locally generated at each module's boundary and consequently translated to g…
  • Cited by 10 (1 self)Add To MetaCart
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