Searching for "Two-dimensional test data compression for scan-based deterministic BIST." – sorted by Relevance.

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2 documents found, showing 1 through 2.

Proceedings IEEE International Test Conference, Baltimore, MD, October 30 -- November 1, 2001
by Two-Dimensional Test Data, Hua-guo Liang, Sybille Hellebr, Hans-joachim Wunderlich — 2001 — Proc. of International Test Conference
… TEST DATA COMPRESSION FOR SCAN-BASED DETERMINISTIC BIST Hua-Guo Liang † , Sybille Hellebrand ‡ , Hans…
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74–78.
by I. Hamzaoglu, J. H. Patel, H. Liang, S. Hellebr, H. -j. Wunderlich, Two-dimensional Test, J. Rajski, J. Tyszer, M. Kassab, N. Kukherjee, R. Thompson, K. -h. Tsai, J. Qian — 2001
…. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-dimensional test data compression for scan-based…
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