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Searching for "The Effectiveness of IDDQ" – sorted by Relevance.

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18 documents found, showing 1 through 10. Next 10 →

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IDDQ Data Analysis Using Current Signature
by James Li And
… the effectiveness of IDDQ testing, and (2) to find the characteristic current signature for every defect class…
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Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing
by Sagar S. Sabade, Duncan M. Walker — 2002 — Proc. IEEE VLSI Test Symposium, 2002
…Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing…
Cited by 5 (2 self) – Add To MetaCart

Nanometer Design: What are the Requirements for Manufacturing Test?
by Janusz Rajski, Kan Thapar
… effectiveness of Iddq test. More fragile transistors also impose restrictions on reliability screening…
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IDDQ Testing for CMOS VLSI
by Rochit Rajsuman, Senior Member — 2000 — Proceedings of the IEEE
… to explain the effectiveness of Iddq testing. In Section IV, design issues, design styles, Iddq test vector…
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Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed
by Oleg Semenov, Arman Vassighi, Manoj Sachdev, M. Renovell — 2003 — Delta IDDQ Testing,” J. Electronic Testing: Theory and Applications
…. The effectiveness of single threshold IDDQ measurement for defect detection is eroded owing to higher and more…
Cited by 1 (0 self) – Add To MetaCart

X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data
by Ashutosh Sharma Anura, Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya
… statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective…
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, H. Manhaeve
by Technical University Of — 1997
…% for currents in the range from 0 to 1mA and a test rate up to 10kHz. Introduction The effectiveness of the IDDQ…
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IDDQ Testability Analysis Using Random Test Vectors
by Von-kyoung Kim, Tom Chen — 1997
… are interested in the behavior of random test pattern in Iddq test, and evaluation of its effectiveness compared…
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Limitations of Built-in Current Sensors (BICS) for IDDQ Testing
by Sankaran M. Menon, Yashwant K. Malaiyaj, Anura P. Jayasumana, Carol Q. Tong — 1993 — In Proceedings of the Asian Test Symposium
…I the output. In IDDQ testing, the propagation of the effect is automatic. Further, it can provide transistor…
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Enhancement of Resolution in Supply Current Based Testing for Large ICS
by Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon — 1991 — In Proceedings of the IEEE VLSI Test Symposium, Atlantic City, NJ (Apr
… of the fault has to be propagated to the output. In IDDQ testing, the propagation of the effect is automatic…
Cited by 6 (1 self) – Add To MetaCart

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