Searching for "Testing FPGA Delay Faults in the System Environment is Very Different from "Ordinary" Delay Fault Testing." – sorted by Relevance.
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FPGA Interconnect Delay Fault Testing
- Abstract FPGA Interconnect Delay Fault Testing Interconnection networks consume the majority
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On applying incremental satisfiability to delay fault testing
- of ISAT to delay fault testing is presented by formulating incremental path sensitization as an ISAT
- Cited by 7 (1 self) – Add To MetaCart
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Transition Delay Fault Testing of Microprocessors by Spectral Method
- Transition Delay Fault Testing of Microprocessors by Spectral Method Nitin Yogi and Vishwani D
- Cited by 4 (3 self) – Add To MetaCart
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BIST-based delay-fault testing in FPGAs
- in the circuit, thus increasing the importance of delay-fault testing. The current FPGA manufacturing testing
- Cited by 9 (0 self) – Add To MetaCart
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On hazard-free patterns for fine-delay fault testing
- On Hazard-free Patterns for Fine-delay Fault Testing Bram Kruseman, Ananta K. Majhi, Guido
- Cited by 4 (1 self) – Add To MetaCart
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Evaluation of Signal Integrity Tests Based On Transition Delay Fault Test Pattern*
- for transition delay test pattern differ from our approach to generate SI test pattern such that they do
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On Theoretical and Practical Considerations of Path Selection For Delay Fault Testing
- On Theoretical and Practical Considerations of Path Selection For Delay Fault Testing ABSTRACT
- Cited by 8 (2 self) – Add To MetaCart
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Delay Fault Testing of Core-Based Systems-on-a-Chip
- Delay Fault Testing of Core-Based Systems-on-a-Chip Qiang Xu and Nicola Nicolici Department
- Cited by 1 (0 self) – Add To MetaCart
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TriScan: A Novel DFT Technique for CMOS Path Delay Fault Testing
- Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing * Ramyanshu Datta, Ravi Gupta
- Cited by 1 (1 self) – Add To MetaCart
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Delay Fault Test Generation for Circuits with Standard Scan Design Considering Three-State Elements
- be used in delay fault testing. Different approaches from the literature for calculating an overall test
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