Searching for "Test pattern generation and partial-scan methodology for an asynchronous SoC interconnect." – sorted by Relevance.
1 documents found, showing 1 through 1.
-
Test Pattern Generation and Partial-Scan Methodology for an Asynchronous SoC Interconnect
- …IEEE TRANSACTIONS ON VLSI SYSTEMS, VOL. X, NO. X, MONTH 200X 1 Test Pattern Generation and Partial-Scan…
- Cited by 2 (0 self) – Add To MetaCart
Showing 1 through 1.
